Go to GlobalSpec.com Home
Alert   Product Alerts
Keep current on the latest products, new suppliers, and technical articles of interest to you. (See Topics)

AXIC, Inc. - Company Profile


Company Profile
   List your products or services on GlobalSpec

Supplier Saved

You have successfully saved AXIC, Inc. to My Suppliers

Print Print
Business Type Address Contact AXIC, Inc.
Manufacturer
Distributor
Sole Distributor
AXIC, Inc.
493 Gianni St.
Santa Clara, CA 95054-2414
USA
Web site
Phone: (408) 980-0240
(800) 475-2762

Search other suppliers in the following categories:
Coating equipment is used to apply organic, inorganic or metal coatings onto part surfaces for industrial applications.
MEMS processing equipment is used to create micro-electro-mechanical systems (MEMS) sensors and wafers.
Semiconductor cluster tools and equipment are used to process semiconductor wafers for the production of microelectronic components.
Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.  
Specialty Cleaning and Surface Preparation Products are specialty or proprietary products and accessories related to cleaning and surface preparation equipment.
Spectrometers are analytical instruments which disperse an emission (such as particles or radiation) according to some property of the emission (such as mass or energy) in order to measure the amount of the dispersion. This product area includes Portable / Miniature, visible, infrared (IR), ultraviolet (UV), atomic absorption (AA), optical emission (OE), Raman, X-ray fluorescence (XRF) and mass spectrometers. Specific search forms are also available.
Thin film equipment uses vacuum processing for the modification of surfaces using CVD, PVD, plasma etching, and thermal oxidation or ion implantation.
Thin film process monitors are used to control thin film deposition rate or composition during processing.
Used and refurbished equipment suppliers specialize in used and refurbished equipment and instruments. Suppliers may have the personnel and/or equipment needed to completely overhaul or rebuild equipment or instruments.
Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing.
X-ray fluorescence spectrometers (XRFs) use a spectroscopic technique that is commonly used with solids, in which X-rays are used to excite a sample and generate secondary X-rays.