inVia Raman Microscope
from Renishaw

Since being launched, the Renishaw inVia Raman microscope has become the world's best selling research Raman system. The inVia Raman microscope combines simplicity of operation with the high performance and unparalleled flexibility for which Renishaw Raman systems are renowned. inVia Raman... [See More]

  • Microscope Type: Acoustic / Ultrasonic (optional feature); Microwave (optional feature); Compound (optional feature); Fluorescent (optional feature); Inverted (optional feature); Laser / Confocal; Polarizing (optional feature); Portable Field (optional feature); Scanning Electron Microscope (optional feature); Scanning Probe / Atomic Force (optional feature); Transmission Electron Microscope (optional feature); Stereomicroscope (optional feature); Raman
  • Grade: Student (optional feature); Benchtop (optional feature); Research
  • Application: Biological / Life Sciences; Gemological; Measuring / Toolmaker / Inspection (optional feature); Medical / Forensic; Metallurgical (optional feature); Semiconductor
  • Optical Technique: Diffraction Grating
Analytical Schottky FE-SEM -- S-4300 SE
from Hitachi High Technologies America, Inc.

Excellent beam current level & stability, effective EBSP measurement [See More]

  • Microscope Type: Scanning Electron Microscope; Schottky FE-SEM
  • Grade: Research
  • Application: Biological / Life Sciences; Medical / Forensic; Metallurgical; Semiconductor
  • Magnification: 20 to 500000
Automated Semiconductor Process Tools -- JFS-9855S / 9955S
from JEOL USA, Inc.

Has a focused ion beam (FIB) milling system, automated wafer metrology [See More]

  • Microscope Type: Scanning Electron Microscope
  • Grade: Research
  • Application: Semiconductor
  • Resolution: 5
eDR-5210
from KLA-Tencor Corporation

KLA-Tencor ’s eDR-52xx wafer defect review systems capture high resolution images of wafer defects detected by inspection tools. These images enable defect classification, helping chipmakers to identify systematic defect sources and resolve yield issues. The latest addition to the eDR-52xx... [See More]

  • Microscope Type: Scanning Electron Microscope
  • Grade: Research
  • Application: Semiconductor
  • User Interface: Digital