Scintillation Diffractometers Datasheets

D4 Endeavor
from Bruker AXS, Inc.

Flexibility for suitably shaped, environment sensitive, small, thin samples [See More]

  • Detector: Linear Position Sensors; Scintillation; Proportional Counter, Energy Dispersive
  • Diffraction Method: Powder
  • Wave: X-Ray
  • Positioning System: Goniometer
CubiX Fast
from PANalytical, Inc.

Quick loading mechanism completes a load/unload cycle in less than 10s [See More]

  • Detector: Linear Position Sensors; Scintillation; Sealed Xe Proportional Detector
  • Diffraction Method: Powder; Reflectometry, X-Ray Scattering
  • Wave: X-Ray
  • Positioning System: Goniometer; Eulerian Cradle; Stage for X, Y or Z positioning of a sample or detector; Sample, Capillary Spinner Stage
Benchtop X-Ray Diffraction (XRD) Instrument -- MiniFlex
from Rigaku Corporation

2012 heralds the newest additions to the MiniFlex series of benchtop X-ray diffraction (XRD) analyzers. The new 5th generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. MiniFlex is now available in two... [See More]

  • Detector: Scintillation
  • Diffraction Method: Powder
  • Wave: X-Ray
  • Positioning System: Goniometer