D4 Endeavor
from Bruker AXS, Inc.

Flexibility for suitably shaped, environment sensitive, small, thin samples [See More]

  • Features: Benchtop; Texture/Preferred Orientation; Measures Crystal Size; Stress Measurement
  • Detector: Linear Position Sensors; Scintillation; Proportional Counter, Energy Dispersive
  • Wave: X-Ray
  • Diffraction Method: Powder
CubiX Fast
from PANalytical, Inc.

Quick loading mechanism completes a load/unload cycle in less than 10s [See More]

  • Features: Benchtop; Texture/Preferred Orientation; Measures Crystal Size; Stress Measurement; High Resolution/Crystal Quality Capabilities
  • Detector: Linear Position Sensors; Scintillation; Sealed Xe Proportional Detector
  • Wave: X-Ray
  • Diffraction Method: Powder; Reflectometry, X-Ray Scattering