Benchtop Diffractometers Datasheets

D4 Endeavor
from Bruker AXS, Inc.

Flexibility for suitably shaped, environment sensitive, small, thin samples [See More]

  • Features: Benchtop; Texture/Preferred Orientation; Measures Crystal Size; Stress Measurement
  • Detector: Linear Position Sensors; Scintillation; Proportional Counter, Energy Dispersive
  • Wave: X-Ray
  • Diffraction Method: Powder
X-ray Diffraction (XRD)
from Bruker Corporation

Non-destructive Characterization of Material Properties. Bruker's X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today. Applications of these qualitative... [See More]

  • Features: Benchtop (optional feature); High Resolution/Crystal Quality Capabilities (optional feature)
  • Diffraction Method: Powder (optional feature); Single Crystal (optional feature); Small-Angle X-ray Scattering (SAXS)
  • Wave: X-Ray
CubiX Fast
from PANalytical, Inc.

Quick loading mechanism completes a load/unload cycle in less than 10s [See More]

  • Features: Benchtop; Texture/Preferred Orientation; Measures Crystal Size; Stress Measurement; High Resolution/Crystal Quality Capabilities
  • Detector: Linear Position Sensors; Scintillation; Sealed Xe Proportional Detector
  • Wave: X-Ray
  • Diffraction Method: Powder; Reflectometry, X-Ray Scattering
Θ/Θ Rotating Anode XRD Diffractometer -- TTRAX III
from Rigaku Corporation

The TTRAX III is the world ’s most powerful diffractometer. Utilizing an 18 kW rotating anode X-ray source in a θ/ θ geometry provides the perfect system for demanding applications. Both thin film diffraction and the determination of trace phases in powdered samples benefit greatly... [See More]

  • Features: Benchtop; High Resolution/Crystal Quality Capabilities
  • Detector: Cross Beam Optical (CBO) Technology
  • Wave: X-Ray
  • Diffraction Method: Powder