Displays / FPD Surface Profilometers Datasheets

reflectCONTROL Compact -- RCC100-105
from Micro-Epsilon Group

reflectCONTROL Compact has been specifically developed for the inspection of lustrous surfaces. The system projects a striped pattern onto the measurement object. Defects on the surface cause deviations from the striped pattern which are recorded by cameras and evaluated by software. [See More]

  • Applications: Automotive; Flat Panel Display; Optics / Photonics; Precision Machining / Grinding; Semiconductors; Production or Factory Use
  • Measurement Capability: 2D / Line Profile; Defects, dimples or film residues
3D Optical Profiler -- NewView™ 600s
from Zygo Corporation

Fast 3D noncontact profilometer, manual benchtop unit [See More]

  • Applications: Aerospace / Defense; Automotive; Coatings / Films; Flat Panel Display; Electronics; Bearings, Gears, Shafting, Seals, etc.; Medical; Nanomaterials; Optics / Photonics; Precision Machining / Grinding; Wear / Triolobogy; Production or Factory Use; Bore / ID Analysis (optional feature); Laboratory Research
  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness; Spacing; Waviness; Hybrid Parameters; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
  • Technology: Optical / Laser
  • Specific Parameters / Measurements: Roughness Average; RMS Roughness ; Mean Peak to Valley Height or roughness depth; Maximum Peak Height; Average Peak Height; Maximum Valley Depth; Total Roughness Height; Total Profile Depth or Height; Base Roughness Depth; Maximum Roughness Depth; Ten Point Height; Skewness; Kurtosis; Waviness Average; Waviness Height; Peak Count; Peak Spacing Average; Core Roughness Depth; Bearing or Relative Material Ratio; SlopeRa (Δa); SlopeRMS (Δa); Swedish Height (H), Peak Density, Summit Spacing & Density, 3D Surface Visualization

New Privacy Policy

We have adopted new policies. Please read each one carefully.