Computer Interface / Networkable Surface Profilometers Datasheets

Sub-Micron Structured Light 3D Scanner -- MIKROCAD LITE
from LMI Technologies

MikroCAD delivers sub-micron accuracy and repeatability on a variety of challenging scan surfaces such as shiny, reflective and steep edges, in contrast to confocal solutions that are unable to handle steeply angled geometries. With MikroCAD 3D Surface Metrology you can: Measure roughness and... [See More]

  • Display & Special Features: PC Interface / Networkable
  • Measurement Capability: Area or three dimensional profile
  • Technology: Optical / Laser
  • Scan / Traverse Length: 0.0315
MarSurf Contour and Surface Measuring Station -- LD 130 / LD 260
from Mahr Federal Inc.

MarSurf LD 130 / LD 260. A step into a new dimension. Combined contour and roughness measurements in just one step come courtesy of proven cutting-edge technology from Mahr metrology. The MarSurf LD 130 and MarSurf LD 260 measuring stations have been systematically developed to draw on the... [See More]

  • Display & Special Features: PC Interface / Networkable
  • Lateral Resolution: 3.15E-8
  • Measurement Capability: Roughness
  • Scan / Traverse Length: 0.0039 to 10.24
Stylus Profilers
from Bruker Corporation

Bruker's Dektak ® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film... [See More]

  • Display & Special Features: PC Interface / Networkable
  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness; Thickness
  • Technology: Contact / Stylus
  • Applications: Electronics (optional feature); Semiconductors (optional feature); Photovoltaic Solar Cell Manufacturing
Crosscheck™ Laser Profile Sensor -- CC3000-100
from Bytewise Measurement Systems

Use CrossCheck for faster startups and changeovers while reducing product scrap and rework. Easily diagnose root causes of product variation to improve dimensional quality and operator variability, enabling 100% product certification. [See More]

  • Display & Special Features: PC Interface / Networkable; SPC or Analysis Software; Video / Graphic Display
  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Flatness; Step Height; Thickness; Warp / Bow
  • Technology: Optical / Laser
  • Specific Parameters / Measurements: Average Peak Height; Maximum Valley Depth; Peak Count
Tropel® CylinderMaster® -- CylinderMaster® 25
from Corning Specialty Materials

First optical instrument to provide extensive quantification of o.d. & i.d. [See More]

  • Display & Special Features: PC Interface / Networkable; Video / Graphic Display
  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness
  • Technology: Optical / Laser
  • Specific Parameters / Measurements: Maximum Roughness Depth
Alpha-Step D-100
from KLA-Tencor Corporation

The KLA-Tencor Development Series of Stylus profilers offer a complete solution focusing on the needs of the engineering and research community. Our Development Series of surface profiler products is designed to match the varied requirements of our customers through the delivery of full featured... [See More]

  • Display & Special Features: PC Interface / Networkable
  • Measurement Capability: 2D / Line Profile; Roughness
  • Technology: Contact / Stylus
  • Vertical Range: 31.5
MicroTrak II Laser Displacement Sensor -- LTC-025-02
from MTI Instruments Inc.

High Speed Laser Sensor utilizing the Latest CMOS / CCD Technology. The Microtrak II features state-of-the-art CMOS laser triangulation technology for precise measurements of displacement, position, vibration and thickness. Unaffected by surface texture, color or stray light, the Microtrak II Laser... [See More]

  • Display & Special Features: PC Interface / Networkable; SPC or Analysis Software (optional feature)
  • Measurement Capability: Spacing; Waviness; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
  • Technology: Optical / Laser
  • Specific Parameters / Measurements: Maximum Peak Height; Maximum Valley Depth; Total Profile Depth or Height