from Bruker Nano Surfaces Division
The ContourGT InMotion 3D Optical Microscope provides the most reliable and detailed surface characterization of dynamic MEMS and other micro-devices in operation. Utilizing white light interferometry, the ContourGT InMotion performs three-dimensional surface measurements of features from 0.1nm to... [See More]
- Display & Special Features: SPC or Analysis Software; Video / Graphic Display
- Measurement Capability: Area or three dimensional profile; Roughness; Step Height
- Technology: Optical / Laser
- Vertical Range: 3.94E-9 to 0.3937
from Mahr Federal Inc.
Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further... [See More]
- Display & Special Features: PC Interface / Networkable; SPC or Analysis Software; Video / Graphic Display
- Measurement Capability: Area or three dimensional profile
- Technology: Optical / Laser
- Vertical Range: 0.0039 to 0.0157
from MTI Instruments Inc.
High Speed Laser Sensor utilizing the Latest CMOS / CCD Technology. The Microtrak II features state-of-the-art CMOS laser triangulation technology for precise measurements of displacement, position, vibration and thickness. Unaffected by surface texture, color or stray light, the Microtrak II Laser... [See More]
- Display & Special Features: PC Interface / Networkable; SPC or Analysis Software (optional feature)
- Measurement Capability: Spacing; Waviness; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
- Technology: Optical / Laser
- Specific Parameters / Measurements: Maximum Peak Height; Maximum Valley Depth; Total Profile Depth or Height
from Bytewise Measurement Systems
Use CrossCheck for faster startups and changeovers while reducing product scrap and rework. Easily diagnose root causes of product variation to improve dimensional quality and operator variability, enabling 100% product certification. [See More]
- Display & Special Features: PC Interface / Networkable; SPC or Analysis Software; Video / Graphic Display
- Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Flatness; Step Height; Thickness; Warp / Bow
- Technology: Optical / Laser
- Specific Parameters / Measurements: Average Peak Height; Maximum Valley Depth; Peak Count
from Zygo Corporation
Fast 3D noncontact profilometer, manual benchtop unit [See More]
- Display & Special Features: PC Interface / Networkable; SPC or Analysis Software; Video / Graphic Display; FFT Analysis; Power Spectrum Density (PSD); Stage, 0.5X-100X Objectives, 1X Zoom
- Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness; Spacing; Waviness; Hybrid Parameters; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
- Technology: Optical / Laser
- Specific Parameters / Measurements: Roughness Average; RMS Roughness ; Mean Peak to Valley Height or roughness depth; Maximum Peak Height; Average Peak Height; Maximum Valley Depth; Total Roughness Height; Total Profile Depth or Height; Base Roughness Depth; Maximum Roughness Depth; Ten Point Height; Skewness; Kurtosis; Waviness Average; Waviness Height; Peak Count; Peak Spacing Average; Core Roughness Depth; Bearing or Relative Material Ratio; SlopeRa (Δa); SlopeRMS (Δa); Swedish Height (H), Peak Density, Summit Spacing & Density, 3D Surface Visualization
