MarSurf Stationary Instruments PC-based -- CWM 100
from Mahr Federal Inc.

3D optical measurement system – confocal microscope with integrated white light interferometer – for measurement and evaluation of surface structures and small components. High precision - non-contact measurement of surface structures. Your results are correct!. Fast measurement - short... [See More]

  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness
  • Applications: Optics / Photonics
  • Specific Parameters / Measurements: Roughness Average; RMS Roughness ; Mean Peak to Valley Height or roughness depth; Total Profile Depth or Height
  • Mounting / Loading Options: Benchtop
MicroTrak PRO 2D Laser Triangulation Scanners -- 10/13
from MTI Instruments Inc.

The Microtrak PRO 2D laser sensor series uses the latest CCD laser triangulation technology that offers high speed precise measurement of up to 700Hz. Our laser head electronics have been specifically designed to protect against high shock and vibration making them suitable for operation in harsh... [See More]

  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Spacing; Waviness; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
  • Specific Parameters / Measurements: Maximum Peak Height; Maximum Valley Depth; Total Profile Depth or Height
  • Technology: Optical / Laser
  • Standards Compliance: ISO / EN
Crosscheck™ Laser Profile Sensor -- CC3000-100
from Bytewise Measurement Systems

Use CrossCheck for faster startups and changeovers while reducing product scrap and rework. Easily diagnose root causes of product variation to improve dimensional quality and operator variability, enabling 100% product certification. [See More]

  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Flatness; Step Height; Thickness; Warp / Bow
  • Specific Parameters / Measurements: Average Peak Height; Maximum Valley Depth; Peak Count
  • Technology: Optical / Laser
  • Lateral Resolution: 0.0012
Tropel® CylinderMaster® -- CylinderMaster® 25
from Corning Specialty Materials

First optical instrument to provide extensive quantification of o.d. & i.d. [See More]

  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness
  • Specific Parameters / Measurements: Maximum Roughness Depth
  • Technology: Optical / Laser
  • Standards Compliance: ISO / EN
Alpha-Step D-100
from KLA-Tencor Corporation

The KLA-Tencor Development Series of Stylus profilers offer a complete solution focusing on the needs of the engineering and research community. Our Development Series of surface profiler products is designed to match the varied requirements of our customers through the delivery of full featured... [See More]

  • Measurement Capability: 2D / Line Profile; Roughness
  • Vertical Range: 31.5
  • Technology: Contact / Stylus
  • Scan / Traverse Length: 1.18
3D Optical Profiler -- NewView™ 600s
from Zygo Corporation

Fast 3D noncontact profilometer, manual benchtop unit [See More]

  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness; Spacing; Waviness; Hybrid Parameters; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
  • Specific Parameters / Measurements: Roughness Average; RMS Roughness ; Mean Peak to Valley Height or roughness depth; Maximum Peak Height; Average Peak Height; Maximum Valley Depth; Total Roughness Height; Total Profile Depth or Height; Base Roughness Depth; Maximum Roughness Depth; Ten Point Height; Skewness; Kurtosis; Waviness Average; Waviness Height; Peak Count; Peak Spacing Average; Core Roughness Depth; Bearing or Relative Material Ratio; SlopeRa (Δa); SlopeRMS (Δa); Swedish Height (H), Peak Density, Summit Spacing & Density, 3D Surface Visualization
  • Technology: Optical / Laser
  • Standards Compliance: ASME; ISO / EN; DIN; JIS