from Bruker Nano Surfaces Division
The ContourGT InMotion 3D Optical Microscope provides the most reliable and detailed surface characterization of dynamic MEMS and other micro-devices in operation. Utilizing white light interferometry, the ContourGT InMotion performs three-dimensional surface measurements of features from 0.1nm to... [See More]
- Measurement Capability: Area or three dimensional profile; Roughness; Step Height
- Vertical Range: 3.94E-9 to 0.3937
- Technology: Optical / Laser
- Applications: Medical; MEMS; Optics / Photonics; Precision Machining / Grinding; Semiconductors; Wear / Triolobogy; Solar Cells
from Mahr Federal Inc.
Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further... [See More]
- Measurement Capability: Roughness
- Specific Parameters / Measurements: Roughness Average
- Technology: Contact / Stylus
- Applications: Bearings, Gears, Shafting, Seals, etc.; Bore / ID Analysis
from Starrett
The Starrett 3800 Surface Roughness Tester is an economical, small, hand-held instrument for measuring surface texture conforming to traceable standards. It can be used on the shop floor in any position including horizontal, vertical and in-between. The easy-to-use 3800 operates on numerous surfaces... [See More]
- Measurement Capability: Roughness; Flatness
- Specific Parameters / Measurements: Roughness Average; Mean Peak to Valley Height or roughness depth
- Technology: Contact / Stylus
- Standards Compliance: ISO / EN; DIN
from Corning Specialty Materials
First optical instrument to provide extensive quantification of o.d. & i.d. [See More]
- Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness
- Specific Parameters / Measurements: Maximum Roughness Depth
- Technology: Optical / Laser
- Standards Compliance: ISO / EN
from KLA-Tencor Corporation
The KLA-Tencor Development Series of Stylus profilers offer a complete solution focusing on the needs of the engineering and research community. Our Development Series of surface profiler products is designed to match the varied requirements of our customers through the delivery of full featured... [See More]
- Measurement Capability: 2D / Line Profile; Roughness
- Vertical Range: 31.5
- Technology: Contact / Stylus
- Scan / Traverse Length: 1.18
from Zygo Corporation
Fast 3D noncontact profilometer, manual benchtop unit [See More]
- Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness; Spacing; Waviness; Hybrid Parameters; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
- Specific Parameters / Measurements: Roughness Average; RMS Roughness ; Mean Peak to Valley Height or roughness depth; Maximum Peak Height; Average Peak Height; Maximum Valley Depth; Total Roughness Height; Total Profile Depth or Height; Base Roughness Depth; Maximum Roughness Depth; Ten Point Height; Skewness; Kurtosis; Waviness Average; Waviness Height; Peak Count; Peak Spacing Average; Core Roughness Depth; Bearing or Relative Material Ratio; SlopeRa (Δa); SlopeRMS (Δa); Swedish Height (H), Peak Density, Summit Spacing & Density, 3D Surface Visualization
- Technology: Optical / Laser
- Standards Compliance: ASME; ISO / EN; DIN; JIS
