Spacing Parameters (PC, Sm) Surface Profilometers Datasheets

P-16+
from KLA-Tencor Corporation

The P-16+ stylus profiler is a surface metrology analysis solution used in a wide range of applications and industries, from R &D departments and universities to production and process monitoring. This surface analysis solution's precise force control provides excellent vertical resolution,... [See More]

  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness; Spacing; Waviness; Step Height
  • Specific Parameters / Measurements: Total Profile Depth or Height; Peak Count
  • Technology: Contact / Stylus
  • Vertical Range: 0.0394
3D Optical Profiler -- NewView™ 600s
from Zygo Corporation

Fast 3D noncontact profilometer, manual benchtop unit [See More]

  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness; Spacing; Waviness; Hybrid Parameters; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
  • Specific Parameters / Measurements: Roughness Average; RMS Roughness ; Mean Peak to Valley Height or roughness depth; Maximum Peak Height; Average Peak Height; Maximum Valley Depth; Total Roughness Height; Total Profile Depth or Height; Base Roughness Depth; Maximum Roughness Depth; Ten Point Height; Skewness; Kurtosis; Waviness Average; Waviness Height; Peak Count; Peak Spacing Average; Core Roughness Depth; Bearing or Relative Material Ratio; SlopeRa (Δa); SlopeRMS (Δa); Swedish Height (H), Peak Density, Summit Spacing & Density, 3D Surface Visualization
  • Technology: Optical / Laser
  • Standards Compliance: ASME; ISO / EN; DIN; JIS