MarSurf Stationary Instruments PC-based -- XCR 20 MarWin
from Mahr Federal Inc.

Marsurf XC 20 + MarSurf XR 20 =. MarSurf XCR 20 - the MarSurf XCR 20 combines the functions of the XC 20 and the XR 20 in a single unit. This saves both space and time. [See More]

  • Technology: Contact / Stylus
  • Specific Parameters / Measurements: Depth
  • Measurement Capability: Roughness
  • Mounting / Loading Options: Benchtop
MicroTrak II Laser Displacement Sensors -- LTC-025-02
from MTI Instruments Inc.

High Speed Laser Sensor utilizing the Latest CMOS / CCD Technology. The Microtrak II features state-of-the-art CMOS laser triangulation technology for precise measurements of displacement, position, vibration and thickness. Unaffected by surface texture, color or stray light, the Microtrak II Laser... [See More]

  • Technology: Optical / Laser
  • Specific Parameters / Measurements: Maximum Peak Height; Maximum Valley Depth; Total Profile Depth or Height
  • Measurement Capability: Spacing; Waviness; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
  • Standards Compliance: ISO / EN
Full-Sized Surface Gages -- 257 Series
from Starrett

Hardened Steel Base. Finest full-size surface gage. Stable steel base is fully hardened, ground and nicely finished. Four frictionally held gage pins that add versatility for referencing the tool [See More]

  • Technology: Contact / Stylus
  • Applications: Bearings, Gears, Shafting, Seals, etc.
  • Measurement Capability: Flatness
  • Display & Special Features: Analog
3D Optical Profiler -- NewView™ 600s
from Zygo Corporation

Fast 3D noncontact profilometer, manual benchtop unit [See More]

  • Technology: Optical / Laser
  • Specific Parameters / Measurements: Roughness Average; RMS Roughness ; Mean Peak to Valley Height or roughness depth; Maximum Peak Height; Average Peak Height; Maximum Valley Depth; Total Roughness Height; Total Profile Depth or Height; Base Roughness Depth; Maximum Roughness Depth; Ten Point Height; Skewness; Kurtosis; Waviness Average; Waviness Height; Peak Count; Peak Spacing Average; Core Roughness Depth; Bearing or Relative Material Ratio; SlopeRa (Δa); SlopeRMS (Δa); Swedish Height (H), Peak Density, Summit Spacing & Density, 3D Surface Visualization
  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness; Spacing; Waviness; Hybrid Parameters; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
  • Standards Compliance: ASME; ISO / EN; DIN; JIS