Waviness Parameters (Wa,Wt ) Surface Profilometers Datasheets

MarSurf Mobile Surface Measuring Instrument -- M 400
from Mahr Federal Inc.

Product features. MarSurf M 400. The best of the mobile devices. Both in the measuring room and increasingly also in the production area, there is a need for surface evaluations requiring skidless tracing. This generally requires more highly skilled operators, more time and more adjustment work. [See More]

  • Measurement Capability: Roughness; Waviness
  • Standards Compliance: ISO / EN; JIS; MOTIF
  • Technology: Contact / Stylus
  • Vertical Range: 0.0098 to 0.0295
Alpha-Step IQ
from KLA-Tencor Corporation

The Alpha-Step IQ stylus-based surface profiler combines high measurement precision with versatility and economy. Ideal for semiconductor pilot lines and materials research, this advanced surface profiler enables faster process learning and higher yields. With guaranteed 8 Ã … (1... [See More]

  • Measurement Capability: 2D / Line Profile; Roughness; Waviness
  • Vertical Range: 0.0787
  • Technology: Contact / Stylus
  • Applications: Coatings / Films; MEMS; Semiconductors
MicroTrak II Laser Displacement Sensor -- LTC-025-02
from MTI Instruments Inc.

High Speed Laser Sensor utilizing the Latest CMOS / CCD Technology. The Microtrak II features state-of-the-art CMOS laser triangulation technology for precise measurements of displacement, position, vibration and thickness. Unaffected by surface texture, color or stray light, the Microtrak II Laser... [See More]

  • Measurement Capability: Spacing; Waviness; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
  • Specific Parameters / Measurements: Maximum Peak Height; Maximum Valley Depth; Total Profile Depth or Height
  • Technology: Optical / Laser
  • Standards Compliance: ISO / EN