Waviness Parameters (Wa,Wt ) Surface Profilometers Datasheets
from Mahr Federal Inc.
Product features. MarSurf M 400. The best of the mobile devices. Both in the measuring room and increasingly also in the production area, there is a need for surface evaluations requiring skidless tracing. This generally requires more highly skilled operators, more time and more adjustment work. [See More]
- Measurement Capability: Roughness; Waviness
- Standards Compliance: ISO / EN; JIS; MOTIF
- Technology: Contact / Stylus
- Vertical Range: 0.0098 to 0.0295
from MTI Instruments Inc.
High Speed Laser Sensor utilizing the Latest CMOS / CCD Technology. The Microtrak II features state-of-the-art CMOS laser triangulation technology for precise measurements of displacement, position, vibration and thickness. Unaffected by surface texture, color or stray light, the Microtrak II Laser... [See More]
- Measurement Capability: Spacing; Waviness; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
- Specific Parameters / Measurements: Maximum Peak Height; Maximum Valley Depth; Total Profile Depth or Height
- Technology: Optical / Laser
- Standards Compliance: ISO / EN