Benchtop Surface Profilometers Datasheets

Sub-Micron Structured Light 3D Scanner -- MIKROCAD LITE
from LMI Technologies

MikroCAD delivers sub-micron accuracy and repeatability on a variety of challenging scan surfaces such as shiny, reflective and steep edges, in contrast to confocal solutions that are unable to handle steeply angled geometries. With MikroCAD 3D Surface Metrology you can: Measure roughness and... [See More]

  • Mounting / Loading Options: Benchtop
  • Measurement Capability: Area or three dimensional profile
  • Technology: Optical / Laser
  • Scan / Traverse Length: 0.0315
3D White Light Interferometer Optical Measuring Unit - MarSurf -- WM 100
from Mahr Federal Inc.

The precision optical measuring instrument MarSurf WM 100 with sub-nanometer resolution and measuring accuracy. A 3D white light interferometer measuring system. Features. Maximum precision with sub-nanometer resolution and measuring accuracy. Suitable for all optical and reflective surfaces, fine... [See More]

  • Mounting / Loading Options: Benchtop
  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile
  • Technology: Optical / Laser
  • Vertical Range: 7.87
3D Optical Surface Profiler -- Nexview™
from Zygo Corporation

Nexview 3D optical surface profiler excels at measuring all surfaces – from super-smooth to very rough, with sub-nanometer precision, independent of field of view. Measurement types include flatness, roughness, large steps and segments, thin films, and steep slopes, with feature heights... [See More]

  • Mounting / Loading Options: Benchtop
  • Measurement Capability: Area or three dimensional profile
Stylus Profilers
from Bruker Corporation

Bruker's Dektak ® stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film... [See More]

  • Mounting / Loading Options: Benchtop (optional feature); Floor (optional feature)
  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Roughness; Thickness
  • Technology: Contact / Stylus
  • Applications: Electronics (optional feature); Semiconductors (optional feature); Photovoltaic Solar Cell Manufacturing
Crosscheck™ Laser Profile Sensor -- CC3000-100
from Bytewise Measurement Systems

Use CrossCheck for faster startups and changeovers while reducing product scrap and rework. Easily diagnose root causes of product variation to improve dimensional quality and operator variability, enabling 100% product certification. [See More]

  • Mounting / Loading Options: Benchtop; Floor; Unit Mounted on Machine or Production Line
  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Flatness; Step Height; Thickness; Warp / Bow
  • Technology: Optical / Laser
  • Specific Parameters / Measurements: Average Peak Height; Maximum Valley Depth; Peak Count
Alpha-Step D-100
from KLA-Tencor Corporation

The KLA-Tencor Development Series of Stylus profilers offer a complete solution focusing on the needs of the engineering and research community. Our Development Series of surface profiler products is designed to match the varied requirements of our customers through the delivery of full featured... [See More]

  • Mounting / Loading Options: Benchtop
  • Measurement Capability: 2D / Line Profile; Roughness
  • Technology: Contact / Stylus
  • Vertical Range: 31.5
Microtrak II Stand-Alone Laser Sensor -- LTC-025-02-SA
from MTI Instruments Inc.

MTII now offers the performance of our standard Microtrak II Laser Triangulation System in a versatile high speed stand-alone configuration for measuring displacement, position, vibration and thickness. Unaffected by surface texture, color or stray light, the Microtrak II is ideal for solving tough... [See More]

  • Mounting / Loading Options: Benchtop; Unit Mounted on Machine or Production Line; Robot IP 67
  • Measurement Capability: Spacing; Waviness; Defects, dimples or film residues; Flatness; Lay / Pattern; Step Height; Thickness; Warp / Bow
  • Technology: Optical / Laser
  • Specific Parameters / Measurements: Maximum Peak Height; Maximum Valley Depth; Total Profile Depth or Height