Dimension Icon® Automated Atomic Force Profiler
from Bruker Nano Surfaces Division

Get the highest performance device characterization and etch depth metrology available with the Dimension Atomic Force Profiler. It is the world's only AFM single-tool fab solution designed for chemical mechanical planarization and etch metrology at 65 nm. Features. Combines the outstanding... [See More]

  • Technology: Other; Atomic Force Profiler
  • Applications: Semiconductors
  • Measurement Capability: Area or three dimensional profile
  • Mounting / Loading Options: Floor
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