DC Electronic Load System
from Chroma ATE, Inc.

Electronic load system, programmable, remote options [See More]

  • Interface: Probe Card or Performance Board
  • Component / Product Tested: Power Supplies or Transformers; Electronic Load
  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface; Load Bank or Electronic Load
  • Tester / Test Capability: Functional; Emulation
Interpro 9000 ATE System
from Intepro Systems

Intepro 9000 is the next generation power supply test. system from Intepro. It is fast, accurate and will cut. your test times dramatically. The modular system has. a high degree of flexibility and is capable of being. configured into highly economic systems for advanced. power electronic test. [See More]

  • Interface: Probe Card or Performance Board
  • Component / Product Tested: Power Supplies or Transformers
  • Type / Form: Platform or Turnkey System; Load Bank or Electronic Load; CAD Interface, Database, Test Program Generator or Other Test Software
  • Tester / Test Capability: Functional
Complex Interfaces -- Cabled Interface
from Interconnect Devices, Inc.

Controlled impedance pathways, bandwidths up to 7 GHz, high density apps. [See More]

  • Interface: Probe Card or Performance Board
  • Component / Product Tested: Semiconductors or Active Components; Linear / Mixed Signal (Analog)
  • Type / Form: Module, Sub-system or ATE Component; Fixture / Interface
IRIS DIE & Wafer Inspection Systems
from SemiProbe

SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]

  • Interface: Probe Card or Performance Board
  • Component / Product Tested: Semiconductors or Active Components
  • Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
  • Tester / Test Capability: Parametric