Fault Diagnostics / Logic Analysis Automated Test Equipment Datasheets
from CHINO Works America Inc.
The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing. [See More]
- Features: Burn-In or Temperature Control; Diagnostics; Temperature Control / Oven
- Component / Product Tested: MEMS or Electromechanical Devices; Passive Components; Loaded PCBs; Power Supplies or Transformers; Optoelectronics; Semiconductors or Active Components
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
- Tester / Test Capability: Life or Endurance Test; Functional