Fault Diagnostics / Logic Analysis Automated Test Equipment Datasheets

Semiconductor Aging Testing Equipment
from CHINO Works America Inc.

The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing. [See More]

  • Features: Burn-In or Temperature Control; Diagnostics; Temperature Control / Oven
  • Component / Product Tested: MEMS or Electromechanical Devices; Passive Components; Loaded PCBs; Power Supplies or Transformers; Optoelectronics; Semiconductors or Active Components
  • Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
  • Tester / Test Capability: Life or Endurance Test; Functional
Battery Charger ATS -- 8500A
from Chroma ATE, Inc.

Battery charger auto test system, 17 ready made test systems, LED detection [See More]

  • Features: Diagnostics; SPC
  • Component / Product Tested: Power Supplies or Transformers; Battery Charger
  • Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Fixture / Interface; Load Bank or Electronic Load; CAD Interface, Database, Test Program Generator or Other Test Software
  • Tester / Test Capability: Parametric; Functional
16-Channel Analog Comparator/Interrupter -- VM4016
from VTI Instruments Corporation

The VM4016 has 16 true differential channels of analog comparator input, that can be selected to provide a VXIbus interrupt or front panel interrupt when the input goes outside the software programmed bounds. The VM4016 is an ideal device in go/no-go testing where a device fails if the voltage... [See More]

  • Features: Diagnostics; SCPI Compatible, Inputs Can be Masked
  • Component / Product Tested: Control Applications
  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit
  • Tester / Test Capability: Go/No-Go Testing