DC Electronic Load System
from Chroma ATE, Inc.

Electronic load system, programmable, remote options [See More]

  • Features: I-V; Remote Sensing
  • Component / Product Tested: Power Supplies or Transformers; Electronic Load
  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface; Load Bank or Electronic Load
  • Tester / Test Capability: Functional; Emulation
Interpro 9000 ATE System
from Intepro Systems

Intepro 9000 is the next generation power supply test. system from Intepro. It is fast, accurate and will cut. your test times dramatically. The modular system has. a high degree of flexibility and is capable of being. configured into highly economic systems for advanced. power electronic test. [See More]

  • Features: I-V; PowerStar 5 Software
  • Component / Product Tested: Power Supplies or Transformers
  • Type / Form: Platform or Turnkey System; Load Bank or Electronic Load; CAD Interface, Database, Test Program Generator or Other Test Software
  • Tester / Test Capability: Functional
V1000 Lifetest System
from TELOPS, Inc.

This vestal platform supports a variety of laser diodes, LEDs and SOAs. The V1000 is a true turnkey solution with everything you need for production burn-in or qualification/ongoing reliability and life testing. [See More]

  • Features: Burn-In or Temperature Control; I-V; Temperature Control / Oven
  • Component / Product Tested: Semiconductors or Active Components
  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit
  • Tester / Test Capability: Life or Endurance Test; Functional
Single-Slot Base Unit -- VM9000
from VTI Instruments Corporation

The award winning VXI Modular Instrumentation Platform (VMIP ™) provides customers with a level of modularity for instruments that is unmatched in the industry. The VMIP ™ makes a single VXIbus card slot three times more powerful than single device solutions. Each VMIP ™ instrument... [See More]

  • Features: C-V (optional feature); I-V (optional feature); SPC (optional feature); Fast Communication
  • Component / Product Tested: Avionics or Military Electronics; Logic ICs; Loaded PCBs
  • Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
  • Tester / Test Capability: Functional