Temperature Controller Automated Test Equipment Datasheets

Semiconductor ThermoChuck® Sytem - 200mm -- TP03000
from Thermonics Corp., an inTEST Company

For the testing, cycling and characterization of wafers and other flat devices at precise temperature. Temperature Range: -65 ° to +200 °C. Chuck Diameters: Available in 6 inch (154 mm) and 8 inch (203 mm) diameters to accommodate wafers up to 200mm in diameter. Chuck Surfaces: Choice of... [See More]

  • Features: Temperature Control / Oven
  • Component / Product Tested: Semiconductors or Active Components
  • Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit
  • Tester / Test Capability: Thermal Stability, Wafer Testing
Environmental Stress Screening (ESS) -- ESS11
from ESPEC North America, Inc.

The ESS5/11 Series provides the unique capability of stress screening products in a small, lab-type chamber. Pre-qualification for ESS, troubleshooting, and small scale ESS programs would all benefit from high air flow, high change rate testing in this compact design. This series can accommodate up... [See More]

  • Features: Burn-In or Temperature Control; Temperature Control / Oven
  • Component / Product Tested: Semiconductors or Active Components
  • Type / Form: Module, Sub-system or ATE Component; Test Chamber
  • Tester / Test Capability: Environmental Stress Test Chamber
V1000 Lifetest System
from TELOPS, Inc.

This vestal platform supports a variety of laser diodes, LEDs and SOAs. The V1000 is a true turnkey solution with everything you need for production burn-in or qualification/ongoing reliability and life testing. [See More]

  • Features: Burn-In or Temperature Control; I-V; Temperature Control / Oven
  • Component / Product Tested: Semiconductors or Active Components
  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit
  • Tester / Test Capability: Life or Endurance Test; Functional