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Full Automatic Compressor Performance Testing Equipment
from CHINO Works America Inc.

The equipment is a full automatic compressor performance testing equipment for measurement of refrigerating capacity of compressors for vehicle-installed air-conditioners. [See More]

  • Features: Temperature Control / Oven; OCR Measurement
  • Component / Product Tested: Compressor
  • Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
  • Tester / Test Capability: Functional
Semiconductor ThermoChuck® Sytem - 200mm -- TP03000
from inTEST Thermal Solutions

For the testing, cycling and characterization of wafers and other flat devices at precise temperature. Temperature Range: -65 ° to +200 °C. Chuck Diameters: Available in 6 inch (154 mm) and 8 inch (203 mm) diameters to accommodate wafers up to 200mm in diameter. Chuck Surfaces: Choice of... [See More]

  • Features: Temperature Control / Oven
  • Component / Product Tested: Semiconductors or Active Components
  • Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit
  • Tester / Test Capability: Thermal Stability, Wafer Testing
Environmental Stress Screening (ESS) -- ESS11
from ESPEC North America, Inc.

The ESS5/11 Series provides the unique capability of stress screening products in a small, lab-type chamber. Pre-qualification for ESS, troubleshooting, and small scale ESS programs would all benefit from high air flow, high change rate testing in this compact design. This series can accommodate up... [See More]

  • Features: Burn-In or Temperature Control; Temperature Control / Oven
  • Component / Product Tested: Semiconductors or Active Components
  • Type / Form: Module, Sub-system or ATE Component; Test Chamber
  • Tester / Test Capability: Environmental Stress Test Chamber
IC Tester -- 575 [575 from B&K Precision]
from Fotronic Corporation / Test Equipment Depot

The Model 575A is able to locate intermittent and temperature related faults by using its unconditional or conditional loop testing modes. Unknown device identification is easily accomplished by selecting SEARCH from the menu, selecting the number of pins on the device and activating Search Mode. [See More]

  • Features: Diagnostics; Temperature Control / Oven; Part Number or Auto Detect
  • Component / Product Tested: Logic ICs; Memory; Passive Components; Semiconductors or Active Components; System-On-Chip; RF & Microwave
  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit; Fixture / Interface
  • Tester / Test Capability: Manufacturing Defect Analyzer; Functional
V1000 Lifetest System
from TELOPS, Inc.

This vestal platform supports a variety of laser diodes, LEDs and SOAs. The V1000 is a true turnkey solution with everything you need for production burn-in or qualification/ongoing reliability and life testing. [See More]

  • Features: Burn-In or Temperature Control; I-V; Temperature Control / Oven
  • Component / Product Tested: Semiconductors or Active Components
  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit
  • Tester / Test Capability: Life or Endurance Test; Functional
5 W Programmable Load -- SMP7600
from VTI Instruments Corporation

Ideal for Unit Under Test Loading or Simulation. 5 Watt High-density Programmable Load Module. Wide Resistance Range from 0.5 ohm to 1.5 Mohm. 0.1 ohm Step Size. Over-voltage, Over-current, and Over-temperature Sensing. External Voltage and Current Sense Outputs. Fail-safe Interrupt Input on Front... [See More]

  • Features: Diagnostics; Self-calibration or Test Verification; Temperature Control / Oven; Wide Resistance Range from .5? to 1.5 M?
  • Component / Product Tested: Sensor Simulation, Process Control
  • Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit; Load Bank or Electronic Load
  • Tester / Test Capability: Manufacturing Defect Analyzer; Functional; Emulation