from CHINO Works America Inc.
The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing. [See More]
- Features: Burn-In or Temperature Control; Diagnostics; Temperature Control / Oven
- Component / Product Tested: MEMS or Electromechanical Devices; Passive Components; Loaded PCBs; Power Supplies or Transformers; Optoelectronics; Semiconductors or Active Components
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
- Tester / Test Capability: Life or Endurance Test; Functional
from Chroma ATE, Inc.
Long distance transmission, burn-in system, production line, multi-display [See More]
- Features: Burn-In or Temperature Control; Diagnostics
- Component / Product Tested: Displays, Video or Vision Equipment; LCM
- Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
- Tester / Test Capability: Parametric; Functional; Emulation
from ESPEC North America, Inc.
The ESS5/11 Series provides the unique capability of stress screening products in a small, lab-type chamber. Pre-qualification for ESS, troubleshooting, and small scale ESS programs would all benefit from high air flow, high change rate testing in this compact design. This series can accommodate up... [See More]
- Features: Burn-In or Temperature Control; Temperature Control / Oven
- Component / Product Tested: Semiconductors or Active Components
- Type / Form: Module, Sub-system or ATE Component; Test Chamber
- Tester / Test Capability: Environmental Stress Test Chamber
from Intepro Systems
Energy Recycling Air Cooled AC & DC Loads. Intepro's electronic loads are ideal where high power bulk loading is required for burn-in and characterisation applications within Telecommunication and Aerospace sectors, Intepro ’s environmental stress screening (ESS)/Burn-in solutions... [See More]
- Features: Burn-In or Temperature Control; I-V
- Component / Product Tested: Power Supplies or Transformers; Networking or Communications Equipment
- Type / Form: Platform or Turnkey System; Load Bank or Electronic Load; CAD Interface, Database, Test Program Generator or Other Test Software
- Tester / Test Capability: Life or Endurance Test
from TELOPS, Inc.
This vestal platform supports a variety of laser diodes, LEDs and SOAs. The V1000 is a true turnkey solution with everything you need for production burn-in or qualification/ongoing reliability and life testing. [See More]
- Features: Burn-In or Temperature Control; I-V; Temperature Control / Oven
- Component / Product Tested: Semiconductors or Active Components
- Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit
- Tester / Test Capability: Life or Endurance Test; Functional
