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Laser Diode Test System -- LIV120
from Artifex Engineering

The LIV120 is a powerful but low cost CW / QCW test sy stem for use in the lab as well as for OEM applications, ideal for. Burn-in Test Equipment. Diode characterization. Quality control of incoming goods. OEM. We offer this instrument with a variety of end stages covering current ranges up to 2A in... [See More]

  • Features: Burn-In or Temperature Control
  • Component / Product Tested: Laser Diodes
  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit
Semiconductor Aging Testing Equipment
from CHINO Works America Inc.

The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing. [See More]

  • Features: Burn-In or Temperature Control; Diagnostics; Temperature Control / Oven
  • Component / Product Tested: MEMS or Electromechanical Devices; Passive Components; Loaded PCBs; Power Supplies or Transformers; Optoelectronics; Semiconductors or Active Components
  • Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
  • Tester / Test Capability: Life or Endurance Test; Functional
LCM Oven Burn-in System -- 2930
from Chroma ATE, Inc.

Long distance transmission, burn-in system, production line, multi-display [See More]

  • Features: Burn-In or Temperature Control; Diagnostics
  • Component / Product Tested: Displays, Video or Vision Equipment; LCM
  • Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
  • Tester / Test Capability: Parametric; Functional; Emulation
Environmental Stress Screening (ESS) -- ESS11
from ESPEC North America, Inc.

The ESS5/11 Series provides the unique capability of stress screening products in a small, lab-type chamber. Pre-qualification for ESS, troubleshooting, and small scale ESS programs would all benefit from high air flow, high change rate testing in this compact design. This series can accommodate up... [See More]

  • Features: Burn-In or Temperature Control; Temperature Control / Oven
  • Component / Product Tested: Semiconductors or Active Components
  • Type / Form: Module, Sub-system or ATE Component; Test Chamber
  • Tester / Test Capability: Environmental Stress Test Chamber
Load Saver -- Life/Burn-In Test
from Intepro Systems

Energy Recycling Air Cooled AC & DC Loads. Intepro's electronic loads are ideal where high power bulk loading is required for burn-in and characterisation applications within Telecommunication and Aerospace sectors, Intepro ’s environmental stress screening (ESS)/Burn-in solutions... [See More]

  • Features: Burn-In or Temperature Control; I-V
  • Component / Product Tested: Power Supplies or Transformers; Networking or Communications Equipment
  • Type / Form: Platform or Turnkey System; Load Bank or Electronic Load; CAD Interface, Database, Test Program Generator or Other Test Software
  • Tester / Test Capability: Life or Endurance Test
V1000 Lifetest System
from TELOPS, Inc.

This vestal platform supports a variety of laser diodes, LEDs and SOAs. The V1000 is a true turnkey solution with everything you need for production burn-in or qualification/ongoing reliability and life testing. [See More]

  • Features: Burn-In or Temperature Control; I-V; Temperature Control / Oven
  • Component / Product Tested: Semiconductors or Active Components
  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit
  • Tester / Test Capability: Life or Endurance Test; Functional