Semiconductor Aging Testing Equipment
from CHINO Works America Inc.

The equipment is semiconductor aging testing equipment to full-automatically execute burn-in processing and data measurement/judgment/analytical processing and also has tester function as well as temperature accelerating testing. [See More]

  • Tester / Test Capability: Life or Endurance Test; Functional
  • Component / Product Tested: MEMS or Electromechanical Devices; Passive Components; Loaded PCBs; Power Supplies or Transformers; Optoelectronics; Semiconductors or Active Components
  • Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
  • Interface: Floating Probe
Load Saver -- Life/Burn-In Test
from Intepro Systems

Energy Recycling Air Cooled AC & DC Loads. Intepro's electronic loads are ideal where high power bulk loading is required for burn-in and characterisation applications within Telecommunication and Aerospace sectors, Intepro ’s environmental stress screening (ESS)/Burn-in solutions... [See More]

  • Tester / Test Capability: Life or Endurance Test
  • Component / Product Tested: Power Supplies or Transformers; Networking or Communications Equipment
  • Type / Form: Platform or Turnkey System; Load Bank or Electronic Load; CAD Interface, Database, Test Program Generator or Other Test Software
  • Features: Burn-In or Temperature Control; I-V
V1000 Lifetest System
from TELOPS, Inc.

This vestal platform supports a variety of laser diodes, LEDs and SOAs. The V1000 is a true turnkey solution with everything you need for production burn-in or qualification/ongoing reliability and life testing. [See More]

  • Tester / Test Capability: Life or Endurance Test; Functional
  • Component / Product Tested: Semiconductors or Active Components
  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit
  • Features: Burn-In or Temperature Control; I-V; Temperature Control / Oven