Handler / Prober Automated Test Equipment Datasheets

Transformer Test System -- 3250
from Chroma ATE, Inc.

Automatic transformer test system, 20Hz-200kHz [See More]

  • Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface; Component Handler or Wafer Prober; CAD Interface, Database, Test Program Generator or Other Test Software
  • Tester / Test Capability: Functional
  • Component / Product Tested: Passive Components; Power Supplies or Transformers; Transformer
  • Features: C-V; Diagnostics; I-V; Resistance or Impedance; SPC
IRIS DIE & Wafer Inspection Systems
from SemiProbe

SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]

  • Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
  • Tester / Test Capability: Parametric
  • Component / Product Tested: Semiconductors or Active Components
  • Interface: Probe Card or Performance Board