Handler / Prober Automated Test Equipment Datasheets

IRIS DIE & Wafer Inspection Systems
from SemiProbe

SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]

  • Type / Form: Platform or Turnkey System; Component Handler or Wafer Prober
  • Tester / Test Capability: Parametric
  • Component / Product Tested: Semiconductors or Active Components
  • Interface: Probe Card or Performance Board