Modular Scanner -- SC6540
from Associated Research, Inc.

The SC6540 modular scanner is designed to automate multi-point and multi-product testing when using OMNIA, HypotULTRA III, or HypotMAX models 7700 and 7704. There are 10 different configurations available that are built off of two basic scanning configurations determined by the power module. A... [See More]

  • Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit; Monitors Hypot Test Equipment
  • Interface: IEEE-488 (GPIB) and RS-2332 interfaces
  • Component / Product Tested: Monitors Hypot Equipment
  • Features: Configurable Scanning Matrix
Full Automatic Compressor Performance Testing Equipment
from CHINO Works America Inc.

The equipment is a full automatic compressor performance testing equipment for measurement of refrigerating capacity of compressors for vehicle-installed air-conditioners. [See More]

  • Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface
  • Tester / Test Capability: Functional
  • Component / Product Tested: Compressor
  • Features: Temperature Control / Oven; OCR Measurement
Semiconductor ThermoChuck® Sytem - 200mm -- TP03000
from inTEST Thermal Solutions

For the testing, cycling and characterization of wafers and other flat devices at precise temperature. Temperature Range: -65 ° to +200 °C. Chuck Diameters: Available in 6 inch (154 mm) and 8 inch (203 mm) diameters to accommodate wafers up to 200mm in diameter. Chuck Surfaces: Choice of... [See More]

  • Type / Form: Module, Sub-system or ATE Component; Input Stimulus or Signal Source Unit
  • Tester / Test Capability: Thermal Stability, Wafer Testing
  • Component / Product Tested: Semiconductors or Active Components
  • Features: Temperature Control / Oven
DC Electronic Load System
from Chroma ATE, Inc.

Electronic load system, programmable, remote options [See More]

  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Fixture / Interface; Load Bank or Electronic Load
  • Tester / Test Capability: Functional; Emulation
  • Component / Product Tested: Power Supplies or Transformers; Electronic Load
  • Interface: Probe Card or Performance Board
Combination Board Tester -- QT2256 [QT2256 from Wayne Kerr Electronics]
from Fotronic Corporation / Test Equipment Depot

128 Digital channels, PXI interface, 12 analog highways matrix [See More]

  • Type / Form: Platform or Turnkey System; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit
  • Tester / Test Capability: In-Circuit Tester; JTAG / Boundary-Scan (optional feature); Functional; Signature Analysis
  • Component / Product Tested: BareBoard; Memory; Passive Components; Loaded PCBs; Power Supplies or Transformers
  • Interface: Floating Probe
10 (1x5) 2-Wire Multiplexer -- SMP3005
from VTI Instruments Corporation

The SMP3005 is designed for scanning of multiple points to a common bus either synchronously with an instrument (i.e., using triggers), or asynchronously with individual relay control. Up to 300 2-wire channels can be accommodated in a double-slot VXIbus card (SMP1200) for maximum density, or mixed... [See More]

  • Type / Form: Module, Sub-system or ATE Component; Output Measurement or Monitoring Unit; Input Stimulus or Signal Source Unit; Multiplexer
  • Tester / Test Capability: Manufacturing Defect Analyzer; Functional; PCB Testing
  • Component / Product Tested: Cables, Harnesses or Backplanes; Loaded PCBs; Semiconductors or Active Components
  • Interface: VXIbus