Semiconductor Inspection Microscopes Datasheets

Fiber Microscope
from HORIBA Scientific

The remote fiber coupled Raman microscope from HORIBA Scientific provides a unique facility for microscopic Raman, photoluminescence (PL) and fluorescence analysis. Ideal for complementing existing instrumentation or for analysis in restricted environments such as fume cupboards and clean rooms, the... [See More]

  • Application: Biological / Life Sciences; Medical / Forensic; Semiconductor
  • Microscope Type: Fiber Microscope
  • Grade: Research
  • Remote Interface: Computer Interface
Advanced Zoom Macro Microscope System -- AZ100 Multizoom
from Nikon Metrology

A multi-purpose zoom microscope system that provides capabilities that don't currently exist with stereomicroscopes and compound high magnification microscopes. The AZ100 Multizoom represents a new concept in zoom microscopes. It covers an extremely wide range of magnifications, from 5x to 400x,... [See More]

  • Application: Gemological; Metallurgical; Semiconductor; Electronics, Composites
  • Microscope Type: Polarizing; Stereomicroscope
  • Grade: Benchtop
  • Optical Technique: Transmitted Light: Brightfield, Nomarski Dic, Simple Polarizing, And Oblique Illumination Observation
A-Zoomµ Micro Manual Probing Microscopes
from Qioptiq

esigned for streamlined operation and compact integration onto a. multitude of probing stations, the A-Zoom µ Micro offers a high-value. solution for circuit board, semiconductor and flat-panel display probing. without sacrificing features, function or performance. 7:1 parfocal Optical zoom. [See More]

  • Application: Semiconductor
  • Microscope Type: Compound; Laser / Confocal (optional feature)
  • Grade: Benchtop
  • Optical Technique: Brightfield
inVia Raman Microscope
from Renishaw

Since being launched, the Renishaw inVia Raman microscope has become the world's best selling research Raman system. The inVia Raman microscope combines simplicity of operation with the high performance and unparalleled flexibility for which Renishaw Raman systems are renowned. inVia Raman... [See More]

  • Application: Measuring / Toolmaker / Inspection (optional feature); Biological / Life Sciences; Gemological; Medical / Forensic; Metallurgical (optional feature); Semiconductor
  • Microscope Type: Acoustic / Ultrasonic (optional feature); Microwave (optional feature); Compound (optional feature); Fluorescent (optional feature); Inverted (optional feature); Laser / Confocal; Polarizing (optional feature); Portable Field (optional feature); Scanning Electron Microscope (optional feature); Scanning Probe / Atomic Force (optional feature); Stereomicroscope (optional feature); Transmission Electron Microscope (optional feature); Raman
  • Grade: Student (optional feature); Benchtop (optional feature); Research
  • Optical Technique: Diffraction Grating
Extra Wide Field Stereo Microscope -- FX - 3
from Titan Tool Supply, Inc.

This Extra Wide Field Stereo Microscope features unusually long Focal Lengths and great Depths of Field in the Lower Magnifications. The accompanying larger fields of view offer greater versatility than most Stereo Microscopes available for Medical or Industrial Applications. Ideal for Inspection,... [See More]

  • Application: Measuring / Toolmaker / Inspection; Metallurgical; Semiconductor
  • Microscope Type: Stereomicroscope
  • Grade: Benchtop
  • Magnification: 5 to 40
Compact Digital Mini Microscope -- MC108 [MC108 from Flir Commercial Systems]
from All-Spec Industries

The Extech MC108 is a compact digital mini microscope with USB interface and software. [See More]

  • Application: Biological / Life Sciences; Medical / Forensic; Semiconductor; Fabric Inspection, Printing Analysis
  • Microscope Type: Portable Field; Digital Microscope
  • Grade: Mini Hand Held
  • Optical Technique: Three White LEDs
3D Optical Microscopes
from Bruker Corporation

Bruker ™s industry-leading Vision64 ® Operation and Analysis Software provides the industry ™s most functional and streamlined graphical user interface.   Combining intelligent architecture with intuitive visual workflow and extensive user-defined automation capabilities,... [See More]

  • Application: Biological / Life Sciences (optional feature); Metallurgical (optional feature); Semiconductor (optional feature)
  • Remote Interface: Computer Interface
  • Features: Digital Display
BGA Lens -- MX-BGAZ II
from Hirox-USA, Inc.

This BGA lens allows ball joints to be observed non-destructively. Also, a 3D optical rotary ring enables 3D observation. This lens incorporates special hardware, such as a prism tip with lighting and a cushion mechanism, to ensure comfortable observation. [See More]

  • Application: Measuring / Toolmaker / Inspection; Biological / Life Sciences; Medical / Forensic; Metallurgical; Semiconductor
  • Microscope Type: Stands & Stage Units Available
  • Grade: Research
  • Magnification: 50 to 200
300kV High Resolution TEM -- H-9500
from Hitachi High Technologies America, Inc.

High resolution, in situ observation at high temperature with gas injection [See More]

  • Application: Biological / Life Sciences; Semiconductor; Nanoscience, Materials Research
  • Microscope Type: Transmission Electron Microscope
  • Grade: Research
  • Magnification: 200 to 1500000
IMV-4000
from JASCO

1.3 megapixel CMOS video CCD camera [See More]

  • Application: Measuring / Toolmaker / Inspection; Biological / Life Sciences; Gemological; Medical / Forensic; Semiconductor
  • Optical Technique: IR
  • Grade: Benchtop
  • Magnification: 16 to 32
Automated Semiconductor Process Tools -- JFS-9855S / 9955S
from JEOL USA, Inc.

Has a focused ion beam (FIB) milling system, automated wafer metrology [See More]

  • Application: Semiconductor
  • Microscope Type: Scanning Electron Microscope
  • Grade: Research
  • Resolution: 5
3D Measurement System -- VR-3000
from KEYENCE

3D Measurement of a Large Area in 4 Seconds. The VR is able to measure across 30 mm in just 4 seconds, with a maximum measurement range of 100 mm x 200 mm. Instead of use a physical probe, the VR utilizes structured lighting to obtain the entire 3D shape of an object. By using telecentric lenses... [See More]

  • Application: Semiconductor
  • Microscope Type: LED Ring Light, White LED
  • Grade: Benchtop
  • Magnification: 12 to 50
eDR-5210
from KLA-Tencor Corporation

KLA-Tencor ’s eDR-52xx wafer defect review systems capture high resolution images of wafer defects detected by inspection tools. These images enable defect classification, helping chipmakers to identify systematic defect sources and resolve yield issues. The latest addition to the eDR-52xx... [See More]

  • Application: Semiconductor
  • Microscope Type: Scanning Electron Microscope
  • Grade: Research
  • Features: Digital Display
Confocal Microscope -- OLS3000-IR
from Olympus America Inc.

The LEXT OLS-3000IR is our new near-IR laser based confocal microscope for nondestructive interior observation of silicon wafers, IC chips, MEMS and other devices. Packaging technology of semiconductor devices is rapidly advancing along with the increase in the need for thinner and smaller... [See More]

  • Application: Semiconductor
  • Microscope Type: Laser / Confocal
  • Grade: Benchtop
  • Optical Technique: Laser
Industrial Microscope -- AL120
from Olympus Corporation of the Americas - Scientific Solutions Group

The AL120 wafer handler series transfers both silicon and compound semiconductor wafers from the cassette to the microscope stage with enhanced capabilities and flexibility, while maintaining an ergonomic design. Accommodates Multiple Wafer Sizes. The ability to accommodate different wafer sizes is... [See More]

  • Application: Semiconductor
  • Microscope Type: Compound
  • Grade: Benchtop
  • Eyepiece Style: Binocular
XE-3DM
from Park Systems, Inc.

Park Systems has revolutionized the AFM with the introduction of the XE-3DM, the fully automated AFM system designed for overhang and trench profiles, sidewall roughness and imaging, and critical angle measurements. The unique design of the XE-3DM, made possible by the XE-series ’ decoupled XY... [See More]

  • Application: Semiconductor
  • Microscope Type: Scanning Probe / Atomic Force
  • Grade: Benchtop
  • Resolution: 1.5
Micro System Analyzer -- MSA-500
from Polytec, Inc.

The MSA-500 Micro System Analyzer is the premier measurement technology for the analysis and visualization of structural vibrations and surface topography in micro structures such as MEMS (Micro-Electro-Mechanical Systems) devices. By fully integrating a microscope with Scanning Laser-Doppler... [See More]

  • Application: Measuring / Toolmaker / Inspection; Semiconductor; Micro System Analyzer
  • Microscope Type: Laser / Confocal; Laser-Doppler Vibrometry, Stroboscopy
  • Grade: Benchtop; Research
  • Features: Digital Display
Laser Scanning Confocal Microscope -- LSCM
from WDI Wise Device Inc.

The LSCM has the advantages of a confocal laser scanning microscope with the size and price of an IR camera. The combination of high contrast imaging, infrared capabilities, extremely small size and low cost enables many new applications. [See More]

  • Application: Biological / Life Sciences; Semiconductor
  • Microscope Type: Laser / Confocal; Digital, Video, Optical, and Light
  • Grade: Industrial
  • Eyepiece Style: Computer