JCM-6000 Neoscope™ Scanning Electron Microscope
from Nikon Metrology Europe

As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM. Born from the combined expertise of Nikon... [See More]

  • Microscope Type: Scanning Electron Microscope
  • Magnification: 10 to 60000
  • Application: Biological / Life Sciences
inVia Raman Microscope
from Renishaw

Since being launched, the Renishaw inVia Raman microscope has become the world's best selling research Raman system. The inVia Raman microscope combines simplicity of operation with the high performance and unparalleled flexibility for which Renishaw Raman systems are renowned. inVia Raman... [See More]

  • Microscope Type: Scanning Electron Microscope (optional feature); Transmission Electron Microscope (optional feature); Raman
  • Features: Digital Display (optional feature)
  • Application: Biological / Life Sciences; Gemological; Metallurgical (optional feature); Measuring / Toolmaker / Inspection (optional feature); Semiconductor; Medical / Forensic
  • User Interface: Analog (optional feature); Digital (optional feature)
Analytical Schottky FE-SEM -- S-4300 SE
from Hitachi High Technologies America, Inc.

Excellent beam current level & stability, effective EBSP measurement [See More]

  • Microscope Type: Scanning Electron Microscope; Schottky FE-SEM
  • Magnification: 20 to 500000
  • Application: Biological / Life Sciences; Metallurgical; Semiconductor; Medical / Forensic
  • Resolution: 1.5
Automated Semiconductor Process Tools -- JFS-9855S / 9955S
from JEOL USA, Inc.

Has a focused ion beam (FIB) milling system, automated wafer metrology [See More]

  • Microscope Type: Scanning Electron Microscope
  • Resolution: 5
  • Application: Semiconductor
  • Features: Digital Display
eDR-5210
from KLA-Tencor Corporation

KLA-Tencor ’s eDR-52xx wafer defect review systems capture high resolution images of wafer defects detected by inspection tools. These images enable defect classification, helping chipmakers to identify systematic defect sources and resolve yield issues. The latest addition to the eDR-52xx... [See More]

  • Microscope Type: Scanning Electron Microscope
  • Features: Digital Display
  • Application: Semiconductor
  • User Interface: Digital
MULTISCAN LAB
from OMICRON NanoTechnology

Combination of STM, SEM and SAM for high resolution structural [See More]

  • Microscope Type: Scanning Electron Microscope
  • Resolution: 20
  • Application: Biological / Life Sciences