Coating Thickness Analyzer -- X-Strata920
from Oxford Instruments Industrial Analysis

The new X-Strata920 from Oxford Instruments offers rapid and reliable XRF coating thickness measurement and materials analysis, combining sleek new design with improved stability and reliability, making a truly cost effective package. New look, enhanced performance & reliability, improved safety... [See More]

  • Analyzer Type: Single Channel
  • Excitation Source: X-Ray Tubes
  • Detector Type: Xe-Filled Proportional Counter
  • Sample Type: Solids