Be Window X-Ray Fluorescence Spectrometers Datasheets

X-Ray Fluorescence Measuring Instrument for Fast and Non-destructive Analysis and Coating Thickness Measurement of Gold and Silver Alloys -- FISCHERSCOPE® X-RAY XAN® 220 / 222
from Fischer Technology, Inc.

The main application of the instruments from the XAN ® range is coating thickness measurement and analysis of gold and other precious-metal alloys. Products in this range stand out through their ease of use and advantageous price-performance ratio. In addition, detectors, apertures and filters... [See More]

  • Detector Window: Window
  • ICP Measurement Mode: Simultaneous
  • Module Type: Energy Dispersive
  • Excitation Source: X-Ray Tubes
Handheld XRF Analyzer -- X-MET8000 Expert
from Oxford Instruments

Our top performer provides the ultimate performance for the testing of the widest variety of alloys; with superior light elements (Mg, Al, Si, P and S), tramps and penalty elements analysis. Our handheld XRF Analyzer, the X-MET8000, delivers the speed and performance required even in the most... [See More]

  • Detector Window: Window
  • Excitation Source: X-Ray Tubes
  • Module Type: Energy Dispersive
  • Sample Type: Solids
EDXRF Analyzer -- EX-6600 SDD
from Xenemetrix Ltd.

EX-6600 SDD. Secondary Target EDXRF. Xenemetrix ’s EX-6600 SDD Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer offers the ultimate in sensitivity and selectivity. The Silicon Drift Detector (SDD) simultaneously delivers lower electronic noise and higher count rates which translates... [See More]

  • Detector Window: Window
  • Excitation Source: X-Ray Tubes
  • Module Type: Energy Dispersive
  • Analyzer Type: Multichannel