IM-6500 Series Image Dimension Measurement System -- IM-6010
from KEYENCE

Image Dimension Measurement System. •. Drastically Reduced Measurement Time. •. Eliminating Individual Differences. •. Easy Setup for Wider Applications. •. Easy Data Management. Instant measurement is provided by a totally new dimension analysis system which defies traditional... [See More]

  • Applications: Assembly Quality; Biotechnology or Medical; Edge Detection; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Non-contact Profilometry; Pattern Recognition; Production & Quality Control; GD&T Tools
  • Feature Resolution: 4.00E-5
  • System Type: Embedded / Vision Engine; Modular / PC-Based; Turnkey / Complete System
  • Mass Storage: 160
CrossCheck™ Laser Profile System
from Bytewise Measurement Systems

Easy to use CrossCheck “shape tools ” measure radius/diameter, height,. width, angle, and location. Master Profile Comparison provides Pass/Fail. testing for contours, and makes small variations easily visible. All for less. than the price of a single point laser sensor. [See More]

  • Applications: Assembly Quality; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Non-contact Profilometry; Pattern Recognition; Presence / Absence; Production & Quality Control; Tool & Die Monitoring; Universal 2D/3D Profile Gauging
  • Inspection Rate: 30
  • System Type: Modular / PC-Based; Turnkey / Complete System
  • Feature Resolution: 1.18E-4
NEXIV -- VMR-10080
from Nikon Metrology, Inc.

Geared for ultra-wide measuring applications, the NEXIV VMR-10080 can handle large flat panels, shadow masks, etching sheets for lead frames, LCDs, mask patterns, and other large workpieces. Among its many features is a 1000 x 800 x 150mm stage stroke, bright diascopic illumination, pinpoint laser... [See More]

  • Applications: Assembly Quality (optional feature); Edge Detection; Electronics or Semiconductor Inspection; Gauging, Scanning & Dimensioning; Pattern Recognition
  • Feature Resolution: 3.94E-6
  • System Type: Modular / PC-Based
  • Operating System: Windows® 2000
Similar parts from Nikon Metrology, Inc.