CV-X100 Series Intuitive Auto-Teaching Machine Vision System
from KEYENCE

CV-X100 Series Intuitive Auto-Teaching Machine Vision System. Power Meets Simplicity. Auto-Teach Inspection. Intuitive Programming Interface. Point and Click Geometric Measurement. Auto-Generate Manual. Full vision toolset (including 1D/2D/OCR). Intuitive interface allows users of all levels to... [See More]

  • Applications: Alignment / Guidance; Assembly Quality; Bar / Matrix Code; Biotechnology or Medical; Color Mark / Color Recognition; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Electronics Rework; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Optical Character Recognition (OCR); Pattern Recognition; Pharmaceutical Packaging; Presence / Absence; Production & Quality Control; Seal Integrity; Tool & Die Monitoring; Web Inspection; Position / Angle
  • Inspection Rate: 212
  • System Type: Embedded / Vision Engine; Modular / PC-Based
  • Network: Ethernet TCP/IP, EtherNet/IP, PROFINET,PLC-Link, Discrete I/O, Serial
CrossCheck™ Laser Profile System
from Bytewise Measurement Systems

Easy to use CrossCheck “shape tools ” measure radius/diameter, height,. width, angle, and location. Master Profile Comparison provides Pass/Fail. testing for contours, and makes small variations easily visible. All for less. than the price of a single point laser sensor. [See More]

  • Applications: Assembly Quality; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Non-contact Profilometry; Pattern Recognition; Presence / Absence; Production & Quality Control; Tool & Die Monitoring; Universal 2D/3D Profile Gauging
  • Inspection Rate: 30
  • System Type: Modular / PC-Based; Turnkey / Complete System
  • Feature Resolution: 1.18E-4
Automated Optical Inspection -- MIC4-AOI
from WDI Wise Device Inc.

WDI's AOI Microscope is designed for fast scanning and defect review applications of a variety of specimen including bare glass, TFT array and colour filter. It provides exceptional image quality, and is limited only by the selection of the microscope objective lens. The microscope features a sturdy... [See More]

  • Applications: Alignment / Guidance; Biotechnology or Medical; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Non-contact Profilometry; Production & Quality Control; Bare Glass Thickness and Defect
  • Network: RS232
  • System Type: Modular / PC-Based
  • Image Source: Line Scan Camera; Optical Microscope; Confocal Laser