IM-6500 Series Image Dimension Measurement System -- IM-6010
from KEYENCE

Image Dimension Measurement System. •. Drastically Reduced Measurement Time. •. Eliminating Individual Differences. •. Easy Setup for Wider Applications. •. Easy Data Management. Instant measurement is provided by a totally new dimension analysis system which defies traditional... [See More]

  • Applications: Assembly Quality; Biotechnology or Medical; Edge Detection; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Non-contact Profilometry; Pattern Recognition; Production & Quality Control; GD&T Tools
  • Feature Resolution: 4.00E-5
  • System Type: Embedded / Vision Engine; Modular / PC-Based; Turnkey / Complete System
  • Mass Storage: 160
CrossCheck™ Laser Profile System
from Bytewise Measurement Systems

Easy to use CrossCheck “shape tools ” measure radius/diameter, height,. width, angle, and location. Master Profile Comparison provides Pass/Fail. testing for contours, and makes small variations easily visible. All for less. than the price of a single point laser sensor. [See More]

  • Applications: Assembly Quality; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Non-contact Profilometry; Pattern Recognition; Presence / Absence; Production & Quality Control; Tool & Die Monitoring; Universal 2D/3D Profile Gauging
  • Inspection Rate: 30
  • System Type: Modular / PC-Based; Turnkey / Complete System
  • Feature Resolution: 1.18E-4
Automated Optical Inspection -- MIC4-AOI
from WDI Wise Device Inc.

WDI's AOI Microscope is designed for fast scanning and defect review applications of a variety of specimen including bare glass, TFT array and colour filter. It provides exceptional image quality, and is limited only by the selection of the microscope objective lens. The microscope features a sturdy... [See More]

  • Applications: Alignment / Guidance; Biotechnology or Medical; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Non-contact Profilometry; Production & Quality Control; Bare Glass Thickness and Defect
  • Network: RS232
  • System Type: Modular / PC-Based
  • Image Source: Line Scan Camera; Optical Microscope; Confocal Laser