from KEYENCE
Image Dimension Measurement System. •. Drastically Reduced Measurement Time. •. Eliminating Individual Differences. •. Easy Setup for Wider Applications. •. Easy Data Management. Instant measurement is provided by a totally new dimension analysis system which defies traditional... [See More]
- Applications: Assembly Quality; Biotechnology or Medical; Edge Detection; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Non-contact Profilometry; Pattern Recognition; Production & Quality Control; GD&T Tools
- Feature Resolution: 4.00E-5
- System Type: Embedded / Vision Engine; Modular / PC-Based; Turnkey / Complete System
- Mass Storage: 160
from Bytewise Measurement Systems
Easy to use CrossCheck “shape tools ” measure radius/diameter, height,. width, angle, and location. Master Profile Comparison provides Pass/Fail. testing for contours, and makes small variations easily visible. All for less. than the price of a single point laser sensor. [See More]
- Applications: Assembly Quality; Container or Product Counting; Edge Detection; Electronics or Semiconductor Inspection; Flaw Detection; Gauging, Scanning & Dimensioning; Food & Beverage; ID Detection / Verification; Non-contact Profilometry; Pattern Recognition; Presence / Absence; Production & Quality Control; Tool & Die Monitoring; Universal 2D/3D Profile Gauging
- Inspection Rate: 30
- System Type: Modular / PC-Based; Turnkey / Complete System
- Feature Resolution: 1.18E-4
from Fluid Imaging Technologies
High speed automated particle analyzer, information from microscopic images [See More]
- Applications: Biotechnology or Medical; Food & Beverage; Materials Analysis; Pattern Recognition; Pharmaceutical Packaging
- Image Source: Area Scan Camera
- System Type: Turnkey / Complete System
- Stage Type: None
from Nikon Metrology, Inc.
Geared for ultra-wide measuring applications, the NEXIV VMR-10080 can handle large flat panels, shadow masks, etching sheets for lead frames, LCDs, mask patterns, and other large workpieces. Among its many features is a 1000 x 800 x 150mm stage stroke, bright diascopic illumination, pinpoint laser... [See More]
- Applications: Assembly Quality (optional feature); Edge Detection; Electronics or Semiconductor Inspection; Gauging, Scanning & Dimensioning; Pattern Recognition
- Feature Resolution: 3.94E-6
- System Type: Modular / PC-Based
- Operating System: Windows® 2000
