11000 Series -- 1110XB
from Cascade Microtech, Inc.

Features high-temperature ceramic low-noise probes [See More]

  • Measurements: Device, gate or circuit electrical testing
  • Mounting / Loading: Manual loading
  • Form Factor: ProbingSystem
  • Technology: Optical / Imaging
IRIS DIE & Wafer Inspection Systems -- EVA Semiautomatic Align, Stepping & Inspection
from SemiProbe

SemiProbe IRIS inspection systems inspect, locate and identify defects created during wafer manufacturing, probing, bumping, dicing or general handling, providing microelectronic device manufacturers with accurate, timely quality assurance and process information. The IRIS inspection system has... [See More]

  • Measurements: Defects, dimples or film residues; Device, gate or circuit electrical testing; Particle contamination; Area mapping
  • Mounting / Loading: Manual loading
  • Form Factor: ProbingSystem
  • Technology: Optical / Imaging
Laser Diode Bar Tester
from TELOPS, Inc.

The laser diode bar tester picks up each laser diode bar from the tape and measures LIV, wavelength and FFP characteristics for each die. [See More]

  • Measurements: Device, gate or circuit electrical testing; LIV, wavelength, & FFP Characteristics
  • Mounting / Loading: Floor
  • Form Factor: Monitor or instrument; ProbingSystem
  • Technology: Optical / Imaging; IV system or SMU; Wafer sorter or prober