Magnetic Properties (Coercivity / Shift) Wafer and Thin Film Instrumentation Datasheets

Polar Kerr System for MRAM
from MicroSense, LLC

The Polar Kerr System for MRAM utilizes the polar Magneto-Optical Kerr Effect (MOKE) to characterize the magnetic properties of multi-layer wafers used in the development and manufacturing of perpendicular MRAM. Utilizing a non-contact full-wafer measurement technique, the system creates a map of... [See More]

  • Measurements: Magnetic properties (coercivity, shift)
  • Mounting / Loading: Floor
  • Form Factor: Monitor or instrument
  • Technology: Magnetometer