from Renishaw
Since being launched, the Renishaw inVia Raman microscope has become the world's best selling research Raman system. The inVia Raman microscope combines simplicity of operation with the high performance and unparalleled flexibility for which Renishaw Raman systems are renowned. inVia Raman... [See More]
- Microscope Type: Acoustic / Ultrasonic (optional feature); Microwave (optional feature); Compound (optional feature); Fluorescent (optional feature); Inverted (optional feature); Laser / Confocal; Polarizing (optional feature); Portable Field (optional feature); Scanning Electron Microscope (optional feature); Scanning Probe / Atomic Force (optional feature); Stereomicroscope (optional feature); Transmission Electron Microscope (optional feature); Raman
- Optical Technique: Diffraction Grating
- Grade: Student (optional feature); Benchtop (optional feature); Research
- Eyepiece Style: Monocular (optional feature); Binocular; Dual Head (optional feature); Trinocular (optional feature)
from Hitachi High Technologies America, Inc.
Excellent beam current level & stability, effective EBSP measurement [See More]
- Microscope Type: Scanning Electron Microscope; Schottky FE-SEM
- Magnification: 20 to 500000
- Grade: Research
- Resolution: 1.5
from JEOL USA, Inc.
Optimized for fitting and integrating X-ray spectrometers [See More]
- Microscope Type: Scanning Electron Microscope
- Magnification: 18 to 300000
- Grade: Research
- Resolution: 3.5
from Nikon Metrology, Inc.
As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM. Born from the combined expertise of Nikon... [See More]
- Microscope Type: Scanning Electron Microscope
- Magnification: 10 to 20000
- Grade: Benchtop
- Accelerating Voltage: 5000 to 15000
from OMICRON NanoTechnology
Combination of STM, SEM and SAM for high resolution structural [See More]
- Microscope Type: Scanning Electron Microscope; Scanning Probe / Atomic Force
- Resolution: 20
- Grade: Research
