inVia Raman Microscope
from Renishaw

Since being launched, the Renishaw inVia Raman microscope has become the world's best selling research Raman system. The inVia Raman microscope combines simplicity of operation with the high performance and unparalleled flexibility for which Renishaw Raman systems are renowned. inVia Raman... [See More]

  • Microscope Type: Acoustic / Ultrasonic (optional feature); Microwave (optional feature); Compound (optional feature); Fluorescent (optional feature); Inverted (optional feature); Laser / Confocal; Polarizing (optional feature); Portable Field (optional feature); Scanning Electron Microscope (optional feature); Scanning Probe / Atomic Force (optional feature); Stereomicroscope (optional feature); Transmission Electron Microscope (optional feature); Raman
  • Optical Technique: Diffraction Grating
  • Grade: Student (optional feature); Benchtop (optional feature); Research
  • Eyepiece Style: Monocular (optional feature); Binocular; Dual Head (optional feature); Trinocular (optional feature)
Scanning Probe Microscopes -- JSPM-4200
from JEOL USA, Inc.

Atomic resolution, software for instrument control & data processing, [See More]

  • Microscope Type: Scanning Probe / Atomic Force
  • Eyepiece Style: Binocular
  • Grade: Research
  • Features: Digital Display
AFM/STM
from OMICRON NanoTechnology

Contact and non-contact afm, and STM [See More]

  • Microscope Type: Scanning Probe / Atomic Force
  • Grade: Research
XE-100
from Park Systems, Inc.

The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology. It is a mid-priced system for materials science, polymers, electrochemistry and other applications in nanoscience and... [See More]

  • Microscope Type: Scanning Probe / Atomic Force
  • Magnification: 160 to 1500
  • Grade: Benchtop; Research
  • Resolution: 1000