Lay / Pattern Surface Metrology Equipment Datasheets
from MTI Instruments Inc.
High Speed Laser Sensor utilizing the Latest CMOS / CCD Technology. The Microtrak II features state-of-the-art CMOS laser triangulation technology for precise measurements of displacement, position, vibration and thickness. Unaffected by surface texture, color or stray light, the Microtrak II Laser... [See More]
- Measurement Capability: Form; Surface Profilometry; Differential / Taper; Flatness; Parallelism; Squareness / Angularity; Spacing; Step Height; Thickness; Straightness; Waviness; Runout; Defects, dimples or film residues; Lay / Pattern; Warp / Bow
- Technology: Optical / Laser
- Standards Compliance: ISO / EN
- Applications: Aerospace / Defense; Automotive; Bearings, Gears, Shafting, Seals, etc.; MEMS; Nanomaterials; Optics / Photonics; Precision Machining / Grinding; Semiconductors; Electronics; Medical (optional feature); Production or Factory Use