from Bruker Nano Surfaces Division
The ContourGT-K0 3D Optical Microscope combines exceptional profiling performance, operator convenience, and affordability into one bench-top instrument. The system utilizes white light interferometry to measure surface topography from nanometer-scale roughness through millimeter-scale steps, with... [See More]
- Measurement Capability: Surface Profilometry; Area or three dimensional profile; Step Height; Thickness; Waviness; Roughness
- Applications: Solar Cells; MEMS; Optics / Photonics; Precision Machining / Grinding; Semiconductors; Medical; Wear / Triolobogy
- Technology: Optical / Laser
- Mounting / Loading Options: Benchtop
from Mahr Federal Inc.
Surface Metrology by Mahr covers roughness and contour measurement. Generally, these devices are based on the tactile stylus method. Thus, two dimensional profiles can be calculated and documented according to international standards. With MarSurf equipment you are ahead, as success and further... [See More]
- Measurement Capability: Surface Profilometry; Waviness; Roughness; Rsk, Rku, Rmr, Pmr, Rpk, Rk, Rvk, RPc, R, Ar, W, Aw, Rx, Wx, Wte, Nr, Ncrx, Nw, CPM, RzJ, S
- Technology: Contact / Stylus
- Standards Compliance: ASME; ISO / EN; DIN; JIS
- Applications: Bearings, Gears, Shafting, Seals, etc.; Production or Factory Use
from MTI Instruments Inc.
High Speed Laser Sensor utilizing the Latest CMOS / CCD Technology. The Microtrak II features state-of-the-art CMOS laser triangulation technology for precise measurements of displacement, position, vibration and thickness. Unaffected by surface texture, color or stray light, the Microtrak II Laser... [See More]
- Measurement Capability: Form; Surface Profilometry; Differential / Taper; Flatness; Parallelism; Squareness / Angularity; Spacing; Step Height; Thickness; Straightness; Waviness; Runout; Defects, dimples or film residues; Lay / Pattern; Warp / Bow
- Applications: Aerospace / Defense; Automotive; Bearings, Gears, Shafting, Seals, etc.; MEMS; Nanomaterials; Optics / Photonics; Precision Machining / Grinding; Semiconductors; Electronics; Medical (optional feature); Production or Factory Use
- Technology: Optical / Laser
- Mounting / Loading Options: Unit Mounted on Machine or Production Line
from Carl Zeiss Industrial Metrology, LLC
Flexible contour measuring station upgradeable to full CNC version [See More]
- Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Waviness; Roughness
- Technology: Contact / Stylus
- Standards Compliance: ASME; ISO / EN; DIN; JIS; CNOMO
- Mounting / Loading Options: Benchtop
from Corning Specialty Materials
Specifically designed for the photomask industry [See More]
- Measurement Capability: Form; Area or three dimensional profile; Flatness; Waviness
- Applications: Automotive; Bearings, Gears, Shafting, Seals, etc.; Optics / Photonics; Precision Machining / Grinding; Semiconductors; Production or Factory Use
- Technology: Optical / Laser
- Accuracy: Uncertainty 20 Nanometers
from KLA-Tencor Corporation
The Alpha-Step IQ stylus-based surface profiler combines high measurement precision with versatility and economy. Ideal for semiconductor pilot lines and materials research, this advanced surface profiler enables faster process learning and higher yields. With guaranteed 8 Ã … (1... [See More]
- Measurement Capability: Surface Profilometry; 2D / Line Profile; Waviness; Roughness
- Applications: MEMS; Semiconductors; Coatings / Films
- Technology: Contact / Stylus
- Mounting / Loading Options: Benchtop
from Polytec, Inc.
For the best yields it is necessary to optimize your process. Measuring and understanding the characteristicsof your product allows continuous improvement. The AVT-1000 enables you to measure all critical parame-ters on metal or glass such as Roughness, Waviness, and Defects. The AVT can measure... [See More]
- Measurement Capability: Area or three dimensional profile; Flatness; Thickness; Waviness; Roughness; Runout; Defects, dimples or film residues
- Technology: Optical / Laser
- Standards Compliance: ASME; ISO / EN
- Mounting / Loading Options: Floor
from Zygo Corporation
Fast 3D noncontact profilometer, manual benchtop unit [See More]
- Measurement Capability: Form; Surface Profilometry; 2D / Line Profile; Area or three dimensional profile; Flatness; Hybrid Parameters; Spacing; Step Height; Thickness; Waviness; Roughness; Defects, dimples or film residues; Lay / Pattern; Warp / Bow; Swedish Height (H), Peak Density, Summit Spacing & Density, 3D Surface Visualization
- Technology: Optical / Laser
- Standards Compliance: ASME; ISO / EN; DIN; JIS
- Applications: Laboratory Research; Aerospace / Defense; Automotive; Bearings, Gears, Shafting, Seals, etc.; Flat Panel Display; Nanomaterials; Optics / Photonics; Precision Machining / Grinding; Coatings / Films; Electronics; Medical; Wear / Triolobogy; Production or Factory Use; Bore / ID Analysis (optional feature)
