DIN Surface Metrology Equipment Datasheets

Contour Measuring System -- Contourecord 1700/2700
from Carl Zeiss Industrial Metrology, LLC

Flexible CNC measuring station for simple contour measurements. All CONTOURECORD machines use the same base column. The only difference is the sensors. With the purchase of additional sensors, you can turn your surface measuring instruments into a contour measuring system – or vice versa. [See More]

  • Standards Compliance: ASME; ISO / EN; DIN; JIS; CNOMO
  • Technology: Contact / Stylus
  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Waviness; Roughness
  • Mounting / Loading Options: Benchtop
MarForm Universal Form Measuring Machine -- MMQ 400
from Mahr Federal Inc.

Product features. MarForm MMQ 400 is suitable for universal use for extensive workpiece evaluation according to DIN ISO 1101. Features. High-precision measuring axes in Z and X make every form measuring task possible. MarForm MMQ 400 is available in different versions for. high-precision workpieces. [See More]

  • Standards Compliance: ISO / EN; DIN
  • Mounting / Loading Options: Benchtop
  • Measurement Capability: Form; Straightness; Roundness; Runout
3D Optical Profiler -- NewView™ 600s
from Zygo Corporation

Fast 3D noncontact profilometer, manual benchtop unit [See More]

  • Standards Compliance: ASME; ISO / EN; DIN; JIS
  • Technology: Optical / Laser
  • Measurement Capability: Form; Surface Profilometry; 2D / Line Profile; Area or three dimensional profile; Flatness; Hybrid Parameters; Spacing; Step Height; Thickness; Waviness; Roughness; Defects, dimples or film residues; Lay / Pattern; Warp / Bow; Swedish Height (H), Peak Density, Summit Spacing & Density, 3D Surface Visualization
  • Applications: Laboratory Research; Aerospace / Defense; Automotive; Bearings, Gears, Shafting, Seals, etc.; Flat Panel Display; Nanomaterials; Optics / Photonics; Precision Machining / Grinding; Coatings / Films; Electronics; Medical; Wear / Triolobogy; Production or Factory Use; Bore / ID Analysis (optional feature)