Contour Measuring System -- Contourecord 1700/2700
from Carl Zeiss Industrial Metrology, LLC

Flexible CNC measuring station for simple contour measurements. All CONTOURECORD machines use the same base column. The only difference is the sensors. With the purchase of additional sensors, you can turn your surface measuring instruments into a contour measuring system – or vice versa. [See More]

  • Standards Compliance: ASME; ISO / EN; DIN; JIS; CNOMO
  • Technology: Contact / Stylus
  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Waviness; Roughness
  • Mounting / Loading Options: Benchtop
MarSurf M 300
from Mahr Federal Inc.

The MarSurf M 300 was developed based on the well-proven class of M-units from Mahr. The Bluetooth interface between evaluation unit and drive unit is unique. This means for you: working even more flexibly without cable connection. A large, illuminated color display to read the parameters and the... [See More]

  • Standards Compliance: ASME; ISO / EN; DIN; JIS
  • Technology: Optical / Laser
  • Measurement Capability: Surface Profilometry; Roughness; Rvk, Rpk, Mr1, Mr2, Rmr, RSm, RPc
  • Applications: Metrology
3D Optical Profiler -- NewView™ 600s
from Zygo Corporation

Fast 3D noncontact profilometer, manual benchtop unit [See More]

  • Standards Compliance: ASME; ISO / EN; DIN; JIS
  • Technology: Optical / Laser
  • Measurement Capability: Form; Surface Profilometry; 2D / Line Profile; Area or three dimensional profile; Flatness; Hybrid Parameters; Spacing; Step Height; Thickness; Waviness; Roughness; Defects, dimples or film residues; Lay / Pattern; Warp / Bow; Swedish Height (H), Peak Density, Summit Spacing & Density, 3D Surface Visualization
  • Applications: Laboratory Research; Aerospace / Defense; Automotive; Bearings, Gears, Shafting, Seals, etc.; Flat Panel Display; Nanomaterials; Optics / Photonics; Precision Machining / Grinding; Coatings / Films; Electronics; Medical; Wear / Triolobogy; Production or Factory Use; Bore / ID Analysis (optional feature)