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CSP Test Socket for Optical Laser Failure Analysis w/Emission Microscopy on any grid size pitch of 0.2mm or higher
from Aries Electronics, Inc.

Available with or without filters for UV, infrared and full spectrum applications, Aries ’ new optical test socket is ideal for testing an optical sensor type chip and for EMMI testing a standard chip using an infrared head sensor. The optical test socket line can accommodate many different... [See More]

  • Product Type: IC Probing / Analysis Adapters
  • Features: Solderless
  • Military Standards: MIL-G-45204
DIP IC Test Clip -- 35F1004 [4124A from Pomona Electronics]
from Newark / element14

DIP IC Test Clip; No. of Contacts:24; Leaded Process Compatible:Yes; Peak Reflow Compatible (260 C):Yes [See More]

  • Product Type: IC Probing / Analysis Adapters
  • RoHS Compliant: RoHS Compliant