How to measure instantaneous RF power
Oscilloscopes can help designers of quadrature-modulation-based communications systems evaluate dynamic power requirements by providing a fast method to measure instantaneous power on very long data records.
Test automation fundamentals
Careful planning and implementation around element locator strategies can yield incredible results for automation suites.
Key factors determine an independent test laboratory's credentials
Chip complexity requires increased testing sophistication, so technical testing laboratories must measure up when conducting functional and/or anti-counterfeit testing
Electronic test 1936-1955, slideshow (Part 3)
Ever wonder what HP''s first product looked like? How about Keithley''s? Check out this slideshow of some old test equipment, back in the day when test equipment was more hardware than software...and sometimes took four hours to warm up!
How to use ECC to protect embedded memories
Multi-bit error correction and automation can be used to meet reliability and volume production goals
Electronic test 1956-1987 (A Look Back: Part 2)
Now here''s some old electronic test equipment! Anyone have these in your lab, basement, memories?
Electronic test 1988-2000 (A Look Back: Part 1)
Check out this slide show of some of historic test equipment. This is Part 1 of 3. The total series spans 1936-2000.
How to validate and analyze complex serial-bus-link models
The goal is to measure the DUT and not the test equipment, fixtures, or cables that are used to acquire the signal. The act of removing the effects of any of these elements can result in a significant improvement in the margin of the device.
Ensure FinFET defect coverage with cell-aware test
The cell-aware test approach to internal cell defect coverage is fully capable of targeting new FinFET defect mechanisms and should prove indispensable in ensuring necessary quality in upcoming designs.
Target impedance based solutions for PDN may not provide realistic assessmentStories 1 - 10 of 161
This article focuses on the fundamental flaws of using target impedance as an assessment method using simple, lumped element models and simulations to highlight some of the key issues.