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Quality, Test & Measurement
April 6, 2011

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Agenda
**Subject to change prior to show date
11:30 AM - 6:00 PM EDT (8:30 AM - 3:00 PM PDT)
Quality, Test & Measurement Open
  • Visit the many booths in the Exhibit Hall, chat with booth representatives, learn about new products, and more.
  • Visit the Networking Lounge and interact with other event attendees.
  • Visit the Resource Center and download all materials of interest.
12:00 PM - 1:00 PM EDT (9:00 AM - 10:00 AM PDT)

From signal switching and coherent modulation to frequency analysis and laser triangulation, new technologies are expanding the boundaries of quality, test and measurement.

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Jim Brennan, News Anchor, GlobalSpec

Serial communications in fiber breaks the 100 Gb/s barrier with coherent modulation, but you now need constellation diagrams, Q plots and polarization analysis to understand signal quality. Optametra's solutions paired with real-time scopes enable comprehensive analysis and data presentation, so you're no longer in the dark.

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Daniel van der Weide, VP of Engineering, Optametra, LLC
1:00 PM - 1:30 PM EDT (10:00 AM - 10:30 AM PDT)
NETWORKING LOUNGE SCHEDULED CHAT:

"How to Design and Test Your Product for Export" Hosted by Dan Beeler, IPS Technician, Interpower Corporation

1:30 PM - 2:30 PM EDT (10:30 AM - 11:30 AM PDT)

Signal switching for test is often left to the last portion of planning and design. This can create problems in that switching affects measurement accuracy, repeatability, and useable life of the system. This presentation will discuss the switching questions to ask when designing a system. Diagnostics will be discussed as a method of ensuring accuracy.

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Bob Stasonis, Americas/Asia Sales & Marketing Director, Pickering Interfaces

The power grid is controlled by detecting the frequency of the power signal. The ability to quickly detect changes in this signal improves power regulation and is useful to end users who want to save data before the loss of power.

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Michael Harney, President, Signal Display Systems
3:00 PM - 4:00 PM EDT (12:00 PM - 1:00 PM PDT)

Because many fabrication processes require accurate thickness control, traditional sensor applications are giving way to laser displacement sensors – especially as they go down in price and up in accuracy. In this presentation, attendees will gain a better understanding of the applications, as well as pitfalls, for this relatively new class of sensors.

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Don Welch, Director of New Business Development, MTI Instruments
4:00 PM - 6:00 PM EDT (1:00 PM - 3:00 PM PDT)
  • Interact with Attendees and Exhibitors in the Exhibit Hall and Networking Lounge.
  • Presentations available On-Demand.