Avantier Telecentric Lenses deliver constant magnification, minimal distortion, and precise measurement for demanding imaging tasks. Ideal for industrial inspection and metrology, we combine rugged construction, versatile working distances, and customizable options—fully tested in-house for reliable performance in harsh conditions. Read more...
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Avantier offers microscope objective lenses delivering superior performance across NIR, NUV, and UV spectral ranges. Featuring advanced coatings, aberration correction, and infinity-corrected designs, they provide exceptional clarity and fidelity, enabling precise imaging for applications in material science, life sciences, and advanced research. Read more...
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High-Precision Relay Lenses: Engineered to transmit image and pupil planes with superior resolution and minimal distortion. Designed for long, stable optical paths, these lenses preserve magnification and image integrity, making them ideal for microscopy, endoscopy, machine vision, laser scanning, and metrology. Read more...
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Avantier designs and manufactures custom precision optics and integrated lens assemblies for quantum computing systems. We work closely with engineering teams to deliver ultra-low-loss, thermally stable optical solutions that improve qubit performance, optical efficiency, and system scalability. Read more...
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The P-616.65S 6-axis scanning and alignment stage provides great value in photonics and micro-optics alignment, featuring a wear-free flexure guiding system and a controller that enables the user to take advantage of its virtual pivot point. Read more...
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EOL is a world leader in the development and manufacture of leading edge, high performance, high stability Transmission Electron Microscopes (TEM). JEOL introduced its first TEM over 70 years ago and has been developing and producing TEMs designed for life sciences and material sciences ever since. Many of the world’s laboratories utilize JEOL TEM/STEMs to further their research ef... Read more...
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The JIB-PS500i provides three solutions to assist TEM specimen preparation. High throughput workflow is assured from specimen prepartion to TEM observation. Read more...
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A new publication in Ultramicroscopy details a breakthrough in magnetic field-free TEM/STEM imaging—featuring the first wide-gap pole piece developed for the JEOL MARS.
Authored by Tatsuhiro Maekawa of JEOL Ltd. and Prof. Arakawa of Shimane University, this study introduces an innovative image-forming system that enables conventional TEM imaging (bright/dark field) without mag... Read more...
The CRYO-FIB-SEM system incorporates a liquid nitrogen cooling stage and a cryocooled specimen transfer mechanism. Read more...
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Transmission Electron Microscopes (TEM) of 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. Read more...
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