The new optoCONTROL 2520 laser micrometer with integrated controller has an extremely compact design. Operators can choose a maximum distance of 2 metres between transmitter and receiver. The measurement object can be placed anywhere within the light curtain that is projected between transmitter and receiver.
Blue Laser scanners now enable high precision profile measurements on shiny, highly polished surfaces. Blue Laser profile sensors perform extremely well, especially where red laser scanners are operating at their limits. Read more...More Product Announcements from Micro-Epsilon Group
The new thicknessSENSOR from Micro-Epsilon opens up even more diverse application possibilities in terms of non-contact thickness measurement. The sensor works extremely precisely combined with ease of use and a compact design, measuring without contact and therefore wear-free. Read more...More Product Announcements from Micro-Epsilon Group
Providing a measuring rate of 70kHz, the confocalDT 2471 HS high speed controller is currently the worldwide fastest confocal chromatic controller. The controller is used for fast distance and thickness measurements of highly reflecting surfaces. Read more...More Product Announcements from Micro-Epsilon Group
The Magna-Mike® 8600 is a portable thickness gage that uses a simple magnetic method to make reliable and repeatable measurements on nonferrous materials. Operation of the Magna-Mike is very simple. Read more...More Product Announcements from Olympus Corporation of the Americas - Scientific Solutions Group
The Supermicrometer is the most popular bench micrometer in the world that can measure just about any manufactured precision OD part, turned part, or gages such as pins, plugs, and threads including API, NPT, NPTF, Dryseal, BSPP, BSPT, UN (Unified), M Profile (Metric), ACME, Buttress, UTS, UNC, UNF, UNEF, UNS, BSW (Whitworth), BA, BSC, BSF, BSP, to name a few. Read more...More Product Announcements from Pratt & Whitney Measurement Systems, Inc.
If you're looking for a direct-reading bench micrometer and an electronic size comparator for use in the calibration laboratory or on the production floor, look no further, the third-generation External Supermicrometer Model C provides durability, digital accuracy, speed of measurement, and range of applications Read more...More Product Announcements from Pratt & Whitney Measurement Systems, Inc.
The ULM is capable of measuring gage blocks, end standards, plain rings, threaded rings & plugs, API gages, pin & plug gages, tapered plugs, cylindrical setting gauges, micrometers, indicators, LVDTs, calipers, and snap gauges with instrument uncertainty to 2 millionths of an inch (0.05 micron). Read more...More Product Announcements from Pratt & Whitney Measurement Systems, Inc.
This laser-based universal length measuring system (ULM) has been developed by Pratt & Whitney for gage calibration laboratories that need to precisely measure length, outside diameter, inside diameter, pitch diameter, lead, major/minor diameter, taper, linear displacement, and thickness. Read more...More Product Announcements from Pratt & Whitney Measurement Systems, Inc.