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  • Process Capability Index
    to produce a 50 µm thickness of anodic coating. The overall coating thickness on the 31 anodized samples was measured with an ISOSCOPE(R) coating thickness gauge (Fischer Scientific, Model MP2C). The Cpk value was calculated in accordance with the variation limit of coating thickness in the MIL-A
  • New Materials - New Reliability Issues
    chemical state. of the atoms in the solid than they are to be macroscopic defects like thinning or metal. contamination. This makes detecting an initial low leakage current an insufficient way to. gauge the reliability of the semiconductor device. The aging of the oxide must be studied. Again

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