Description: The ContourGT-X8 provides the highest speed, accuracy, and range for
3D, non-contact surface measurement of ophthalmic lenses, medical devices and
tools, high-brightness LEDs, semiconductor devices, through-silicon vias and trenches, solar cells, and precision machined parts. The gauge-capable
- Application: Semiconductor Inspection
- Grade: Research
- Microscope Type: Interferometric
- Digital Display: Yes