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  • Explorations in Effusivity
    as a key metric for improved process control in blending and drying, and a cornerstone of the process analytical technology (PAT) movement. Those in attendance heard representatives of several industry leaders, such as Wyeth, AstraZeneca and contract manufacturer Patheon, put down their proprietary
  • NIWeek stresses the need for innovation
    Links between LabView and solid models get firmed up. While the economy may be in a downturn, there was no indication of that at NIWeek 2009, the annual users conference held by (NI) in Austin, Tex. In fact, attendance grew 5% over last year, a sign that companies are eager to embrace technology
  • Joel Orr Commentary: The Next Generation
    their earnestness and passion for engineering. (And not only because eight of them are my grandchildren!) At the same time, several people pointed out that most COFES attendees are at least in their forties and fifties. Of course, this is true. COFES attendance is by invitation only, and we require
  • | Electronics Industry News for EEs & Engineering Managers
    at the 90-nm process node than at any other technology shift. Trust designs, but verify, say panelists Successful IC verification cannot be relegated to second fiddle in the design orchestra, according to experts at the Design Automation Conference. DAC attendance up slightly in 2005 Preliminary

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