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Parts by Number for Boundary Scan Top

Part # Distributor Manufacturer Product Category Description
SCAN18373TSSCX Perfect Parts Corporation FAIRCHILD SEMICONDUCTOR CORP Bus Driver/Transceiver SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO56
SCAN16512SM Perfect Parts Corporation TEXAS INSTRUMENTS INC Bus Driver/Transceiver BOUNDARY SCAN TRANSCEIVER
PIC24FJ192GB108 Microchip Technology, Inc. Microchip Technology, Inc. Not Provided Control - 10,000 erase/write cycles - 20 year data retention - EEprom emulation capable. System - Internal oscillator support - 31 kHz to 8 MHz, up to 32 MHz with 4X PLL - On-chip LDO Voltage Regulator - JTAG Boundary Scan and Flash Memory Program Support - Fail-Safe Clock Monitor – allows safe...
PIC24FJ256GB106 Microchip Technology, Inc. Microchip Technology, Inc. Not Provided Control - 10,000 erase/write cycles - 20 year data retention - EEprom emulation capable. System - Internal oscillator support - 31 kHz to 8 MHz, up to 32 MHz with 4X PLL - On-chip LDO Voltage Regulator - JTAG Boundary Scan and Flash Memory Program Support - Fail-Safe Clock Monitor – allows safe...
dsPIC33FJ06GS101 Microchip Technology, Inc. Microchip Technology, Inc. Not Provided Single Cycle Execution. Single-Cycle Multiply and Accumulate. 32-bit by 16-bit Hardware Divider. C Compiler Optimized Instruction Set System. Internal oscillator and Phase-Locked Loop (PLL) with 120 MHz VCO. On-chip LDO Voltage Regulator. JTAG Boundary Scan and Flash Memory Program Support. Fail-Safe...
SN74BCT8244ANTE4 Newark / element14 TEXAS INSTRUMENTS Not Provided TEXAS INSTRUMENTS - SN74BCT8244ANTE4 - IC; BOUNDARY-SCAN TEST DEVICE; DIP-24
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Conduct Research Top

  • JTAG Testing and Boundary-Scan Testing
    JTAG testing and boundary-scan testing are used by automatic test equipment (ATE) for surface mount technology (SMT) and on-chip circuitry. These test techniques allow complete controllability and observability of the boundary (I/O) pins via a standard interface. JTAG is an acronym for the Joint
  • Micro-Optical Sensors for Boundary Layer Flow Studies (.pdf)
    This manuscript describes optical MEMS (or MOEMS)-based microsensors for near wall boundary layer flow and particle field analysis. The sensors have been developed to measure a variety of parameters including flow velocity, surface speed, skin friction, and particle sizing. The surface mounted
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Kaiser lab explores future of health care A tour of Kaiser Permanente's Sidney R. Garfield Health Care Innovation Center gives a picture of the kinds of medical technologies and services health care providers are testing and the issues they face. Consortium surveys boundary scan use
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Kaiser lab explores future of health care A tour of Kaiser Permanente's Sidney R. Garfield Health Care Innovation Center gives a picture of the kinds of medical technologies and services health care providers are testing and the issues they face. Consortium surveys boundary scan use
  • for HP-UX, Linux, and Windows Server 2003. Intel NetBurst microarchitecture, SSE2, SSE3, HT Technology, 128-bit floating-point port, thermal monitoring, BIST, IEEE 1149.1 standard test access port and boundary scan. Intel Centrino technology, supports notebooks less than 1 inch thick, dedicated stack
  • Medical Device Link . Advanced Electronic Packaging Techniques Enhance Function, Performance, and Portability
    BGA assembly can only be achieved by excellent and consistent process controls, which are not always present in traditional PCB assembly operations. For example, boundary-scan capability built into the silicon die can electrically detect interconnection opens and shorts without x-ray inspection
  • Advanced Twin Characterization using OIM (.pdf)
    tolerance) with the grain. boundary plane. Coherent Twins in OIM. The first criterion of the misorientation across twin. boundary being of specific type has been implemented. within OIM since the very first version. Since OIM scans. are inherently two dimensional, it is not possible to. determine whether
  • Green Metallography (.pdf)
    in the scanning. electron microscope (SEM). EBSD measures and quantifies this orientation and the measured data can. be used to perform most types of traditional metallographic analyses. OIM maps can actual y be used as input into digital metallographic analysis systems. Is that a Grain Boundary

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