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Parts by Number for Boundary Scan Top

Part # Distributor Manufacturer Product Category Description
BSDL files for SAM3A Atmel Corporation Atmel Corporation Not Provided Boundary Scan Description Language files
SCAN18374TSSC Perfect Parts Corporation NATIONAL SEMICONDUCTOR CORP Bus Driver/Transceiver SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO56
SCAN18540TSSC Perfect Parts Corporation NATIONAL SEMICONDUCTOR CORP Bus Driver/Transceiver SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, INVERTED OUTPUT, PDSO56
SN74BCT8244ANTE4 Newark / element14 TEXAS INSTRUMENTS Not Provided TEXAS INSTRUMENTS - SN74BCT8244ANTE4 - IC; BOUNDARY-SCAN TEST DEVICE; DIP-24
SN74LVTH18646APM Perfect Parts Corporation TEXAS INSTRUMENTS INC Bus Driver/Transceiver LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64
SN74LVTH182512DGGR Perfect Parts Corporation TEXAS INSTRUMENTS INC Bus Driver/Transceiver LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO64
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Conduct Research Top

  • JTAG Testing and Boundary-Scan Testing
    JTAG testing and boundary-scan testing are used by automatic test equipment (ATE) for surface mount technology (SMT) and on-chip circuitry. These test techniques allow complete controllability and observability of the boundary (I/O) pins via a standard interface. JTAG is an acronym for the Joint
  • Micro-Optical Sensors for Boundary Layer Flow Studies (.pdf)
    This manuscript describes optical MEMS (or MOEMS)-based microsensors for near wall boundary layer flow and particle field analysis. The sensors have been developed to measure a variety of parameters including flow velocity, surface speed, skin friction, and particle sizing. The surface mounted
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Kaiser lab explores future of health care A tour of Kaiser Permanente's Sidney R. Garfield Health Care Innovation Center gives a picture of the kinds of medical technologies and services health care providers are testing and the issues they face. Consortium surveys boundary scan use
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Kaiser lab explores future of health care A tour of Kaiser Permanente's Sidney R. Garfield Health Care Innovation Center gives a picture of the kinds of medical technologies and services health care providers are testing and the issues they face. Consortium surveys boundary scan use
  • for HP-UX, Linux, and Windows Server 2003. Intel NetBurst microarchitecture, SSE2, SSE3, HT Technology, 128-bit floating-point port, thermal monitoring, BIST, IEEE 1149.1 standard test access port and boundary scan. Intel Centrino technology, supports notebooks less than 1 inch thick, dedicated stack
  • Medical Device Link . Advanced Electronic Packaging Techniques Enhance Function, Performance, and Portability
    BGA assembly can only be achieved by excellent and consistent process controls, which are not always present in traditional PCB assembly operations. For example, boundary-scan capability built into the silicon die can electrically detect interconnection opens and shorts without x-ray inspection
  • Advanced Twin Characterization using OIM (.pdf)
    tolerance) with the grain. boundary plane. Coherent Twins in OIM. The first criterion of the misorientation across twin. boundary being of specific type has been implemented. within OIM since the very first version. Since OIM scans. are inherently two dimensional, it is not possible to. determine whether
  • Green Metallography (.pdf)
    in the scanning. electron microscope (SEM). EBSD measures and quantifies this orientation and the measured data can. be used to perform most types of traditional metallographic analyses. OIM maps can actual y be used as input into digital metallographic analysis systems. Is that a Grain Boundary

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