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Parts by Number Top

Part # Distributor Manufacturer Product Category Description
SCAN18373TSSCX Perfect Parts Corporation FAIRCHILD SEMICONDUCTOR CORP Bus Driver/Transceiver SCAN/JTAG/3J SERIES, DUAL 9-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO56
SCAN16512SM Perfect Parts Corporation TEXAS INSTRUMENTS INC Bus Driver/Transceiver BOUNDARY SCAN TRANSCEIVER
PIC24FJ192GB108 Microchip Technology, Inc. Microchip Technology, Inc. Not Provided Control - 10,000 erase/write cycles - 20 year data retention - EEprom emulation capable. System - Internal oscillator support - 31 kHz to 8 MHz, up to 32 MHz with 4X PLL - On-chip LDO Voltage Regulator - JTAG Boundary Scan and Flash Memory Program Support - Fail-Safe Clock Monitor – allows safe...
PIC24FJ256GB106 Microchip Technology, Inc. Microchip Technology, Inc. Not Provided Control - 10,000 erase/write cycles - 20 year data retention - EEprom emulation capable. System - Internal oscillator support - 31 kHz to 8 MHz, up to 32 MHz with 4X PLL - On-chip LDO Voltage Regulator - JTAG Boundary Scan and Flash Memory Program Support - Fail-Safe Clock Monitor – allows safe...
dsPIC33FJ06GS101 Microchip Technology, Inc. Microchip Technology, Inc. Not Provided Single Cycle Execution. Single-Cycle Multiply and Accumulate. 32-bit by 16-bit Hardware Divider. C Compiler Optimized Instruction Set System. Internal oscillator and Phase-Locked Loop (PLL) with 120 MHz VCO. On-chip LDO Voltage Regulator. JTAG Boundary Scan and Flash Memory Program Support. Fail-Safe...
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Conduct Research Top

  • JTAG Testing and Boundary-Scan Testing
    JTAG testing and boundary-scan testing are used by automatic test equipment (ATE) for surface mount technology (SMT) and on-chip circuitry. These test techniques allow complete controllability and observability of the boundary (I/O) pins via a standard interface. JTAG is an acronym for the Joint
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Kaiser lab explores future of health care A tour of Kaiser Permanente's Sidney R. Garfield Health Care Innovation Center gives a picture of the kinds of medical technologies and services health care providers are testing and the issues they face. Consortium surveys boundary scan use
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Kaiser lab explores future of health care A tour of Kaiser Permanente's Sidney R. Garfield Health Care Innovation Center gives a picture of the kinds of medical technologies and services health care providers are testing and the issues they face. Consortium surveys boundary scan use

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