CME Metrology

Products/Services for CME Metrology

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  Material Testing Services - (947 companies)

  Material testing services test, analyze, and certify a wide range of materials for purity, chemical compatibility, and environmental impact. Search by Specification | Learn More

  Capabilities:

  • Assays / Quantitative
  • Chemical Testing Services
  • Cleanliness Monitoring / Testing
  • Deformulation / Reverse Engineering
  • Environmental Exposure Testing

  Materials:

  • Adhesives / Sealants
  • Asbestos / Fibers
  • Ceramics / Glass
  • Chemicals
  • Coatings

  Test Methods:

  • Acoustic Microscopy (SAM)
  • Ash Testing / Filler Content
  • Atomic Absorption Spectroscopy (AA)
  • Auger Spectroscopy (AES)
  • Chemical Extraction
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  Dimensional Measurement and Metrology Services - (215 companies)

  Dimensional measurement and metrology services use mechanical gaging, CMM measurement, non-contact imaging or other specialized methods to inspect and measure part dimensions and geometry. Dimensional measurement and metrology services use... Search by Specification | Learn More
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  Metrology Fixtures and CMM Fixtures - (55 companies)

  Metrology fixtures and CMM fixtures are used to hold and position parts, probes, or workpieces during dimensional gaging and other measurement operations. Metrology, the science of measurement, entails both practical and theoretical considerations... Learn More
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  Semiconductor Metrology Instruments - (179 companies)

  Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers... Search by Specification | Learn More
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  Surface Metrology Equipment - (300 companies)

  Surface metrology equipment is used to measure the surface finish and/or geometry of engineering components. Surface texture and topology characteristics include surface roughness, contour, form, waviness, and defects. How to Select Surface... Search by Specification | Learn More
• Wafer and Thin Film Instrumentation - (347 companies)

  Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film... Search by Specification | Learn More
• Imaging Workstations - (290 companies)

  Imaging workstations are vision systems used for metrology or image analysis in laboratory and cleanroom settings. Imaging workstations are vision systems with integrated camera, image capture, processing, storage, analysis and control systems... Search by Specification | Learn More
• Dimensional Gages and Instruments - (1115 companies)

  Dimensional gages and instruments provide quantitative measurements of product or component dimensional and form attributes such as wall thickness, depth, height, length, inner diameter (ID), outer diameter (OD), taper or bore. Search by Specification | Learn More
• Condition Monitoring and Machine Maintenance Services - (485 companies)

  Condition monitoring and machine maintenance services monitor the condition of critical machines, battery banks, power supplies, processes and rotary equipment. They also perform predictive maintenance (PdM) and/or preventive maintenance. Search by Specification | Learn More
• Interferometers - (111 companies)

  Interferometers measure distance in terms of wavelength and determine the wavelengths of light sources. Search by Specification | Learn More

Product News for CME Metrology

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  Metal Cutting Corporation
  Cleanroom Metrology

  Our cleanroom houses an array of custom designed system integrated metrology devices. Our cleanroom facility contains LVDT fulcrum beam measuring systems for high volume measuring of micron tolerances, twin sequential camera vision systems using parallel computer processors for defect identification and dual laser PLC full circumference parallelism and concentricity inspection. Throughout our factory are multi-stage ultrasonic cleaning stations, multiple dimensional diverging graders, single... (read more)
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  Lapmaster International
  Lapmaster FTP 130 for Metrology

  Lapmaster International LLC presents the FTP 130 as a new product addition to its Metrology Line. The FTP 130 is a 3 way measuring system which accurately measures the flatness, thickness and parellelism of both 1 and 2 sided parts. Up to two different functions can be used simultaneously to measure parts as thin as 0.20mm or as thick as 200mm. It also comes with a new analog-digital display that elimates the possibility of any inaccuracies. This unit provides a very cost effective, compact... (read more)
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  Nikon Metrology, Inc.
  iSpace Metrology System for Archeology

  Drawing of contexts, sections and site plans can easily consume a huge part of the total excavation time. For particularly complicated and detailed sites this can even rise to as much as half of the total project time. To increase the productivity of these dedicated activities, Nikon Metrology presents the Archeology variant of its iSpace large-scale metrology system. Trials at Mont Beuvray, France, have shown that the Archeology iSpace solution records data 50% to 90% faster compared... (read more)
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  PixeLINK
  Machine Vision Cameras for Metrology

  Metrology. To measure objects with precision, companies frequently turn to PixeLINK® machine vision cameras. Measure Complex Shapes. Organizations looking to measure irregular, complex or precision parts require a machine vision camera solution that offers a high frame rate, excellent image quality and high resolution. For these reasons, companies looking to develop metrology systems for electronics, semiconductors, or any complex manufacturing product choose PixeLINK® industrial cameras... (read more)
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  Rigaku Corporation
  TXRF-V310 Metrology Instrument

  TXRF analysis can gauge contamination in all fab processes, including cleaning, litho, etch, ashing, films, etc. The TXRF-V310 can measure elements from Na through U with a single-target, 3-beam X-ray system and a solid-state detector system. The TXRF-V310 includes Rigaku's patented XY θ sample stage system, an in-vacuum wafer robotic transfer system, and new user-friendly windows software. All of these contribute to higher throughput, higher accuracy and precision, and easy routine... (read more)

Parts by Number for CME Metrology