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  • Application: Oscilloscope Feed Loops Use Reed Relays
    . r F. e. F e. e d. e b. d a. b c. a k. c. k L. o. L o. o p. o s. p. RE. R ED. D RE. R LA. L YS. Y RE. R ED. D SE. S NS. N OR. O S. R RE. R ED. D S. WI. W T. I CH. C E. H S. In. I t. n r. t o. r d. o u. d c. u t. c i. t o. i n. o. Electronics based products play an indispensable role in our everyday
  • Using LeCroy Digital Oscilloscope with MATLAB
    routines. Requires MATLAB's Instrument Control Toolbox. 2. Live Data Streaming - Use MATLAB directly on Windows-based LeCroy oscilloscopes to stream data into and out of MATLAB on every trigger event. Define a Custom math channel using MATLAB and enter your analysis routine into the data stream
  • Agilent: Five Hints for Debugging Microcontroller-Based Designs
    clocks in asynchronous serial communications. It's almost impossible to design an electronic or electromechanical product these days without using a microcontroller (MCU). While there are plenty of interesting design challenges, the debugging tools for MCU-based designs haven't always kept up
  • Long Scan Autocorrelator
    of operation is based on recording the second order correlation function using a Michelson Interferometer. An incoming pulse with electric field E(t), is first split into two replicas by means of a beamsplitter. DS-09041 App Note 11.qxd APPLICATION NOTE. Long Scan Autocorrelator. 27. Technology
  • The New Era of Automated Test
    The automated test scales have tipped and it's time for a faster, smaller, more cost-effective solution than classic rack-and-stack options. Read the whitepaper to learn how test engineers are switching to PXI-based test systems. The New Era of Automated Test - Developer Zone - National Instruments
  • Electron-Beam Steering (Feedback-Loop) for Scanning Lithography
    The customer uses a scanning-electron-beam lithography instrument. Their current digital pattern-generator is based on a commercial high-performance array processor, which uses dual RISC-processors. The system is capable of creating large-area patterns composed of multiple stitched fields
  • Agilent: Automotive Electronic Functional Test Using Agilent System Components
    , most test racks use. GPIB. either a standalone rack-mounted PC or an embedded. VXI. PC in a cardcage such as VXI or PXI. Standalone PCs. generally cost much less than the equivalent embedded. GPIB. LAN-based. Synthetic. Cardcage. PC and also have plenty of room for peripherals inside,. instruments
  • Hopkinson Bar Testing: Testing Materials for Reactions to Stress Pulses
    . GageScope also allows the customer to specify a "Trigger Delay" in order to view different parts of the signal(s). CompuScope 8012A/PCI is a PCI bus based A/D card which acts as a Transient Digitizer in this application. The card takes a "snapshot" of the input signals: once data is captured, software

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